# US 11,906,676 B2 · Radiation detectors with scintillators

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- Number: US 11,906,676 B2
- Document ID: US11906676B2
- Status: Granted
- Kind: B2
- Application number: 17/471,715
- Filed: 2021-09-10
- Published: 2021-12-30
- Granted: 2024-02-20
- Earliest claimed: 2019-03-29
- Assignees: Shenzhen Xpectvision Technology Co., Ltd.
- Applicants: Shenzhen Xpectvision Technology Co., Ltd.
- Inventors: Peiyan Cao; Yurun Liu
- Web page: https://patentgrep.com/patent/US11906676B2

## CPC

- G01T 1/2018: {Scintillation-photodiode combinations}
- G01T 1/2002: {Optical details, e.g. reflecting or diffusing layers}
- G01T: MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry G01N23/00; tubes for determining the presence, intensity, density or energy of radiation or particles H01J47/00)

## Abstract

Disclosed herein is a radiation detector, comprising a first pixel; a first reflector; and a first scintillator, wherein the first reflector is configured to guide essentially all photons emitted by the first scintillator into the first pixel. The first reflector is configured to reflect photons emitted by the first scintillator toward the first reflector. The first scintillator is essentially completely enclosed by the first reflector and the first pixel.

## Claims

### Claim 1

A radiation detector, comprising:
a first pixel;
a first reflector;
a first scintillator;
a first substrate;
a second pixel adjacent to the first pixel;
a second reflector; and
a second scintillator;
wherein the first scintillator is in direct physical contact with the first pixel;
wherein the first reflector is configured to guide essentially all photons emitted by the first scintillator into the first pixel;
wherein the second reflector is configured to guide essentially all photons emitted by the second scintillator into the second pixel;
wherein the first reflector is in direct physical contact with the second reflector;
wherein the first scintillator is in a recess into a surface of the first substrate.

### Claim 2 (depends on 1)

The radiation detector of claim 1, wherein the first reflector is in direct physical contact with the first scintillator.

### Claim 3 (depends on 1)

The radiation detector of claim 1, wherein the first reflector is configured to reflect photons emitted by the first scintillator toward the first reflector.

### Claim 4 (depends on 1)

The radiation detector of claim 1, wherein the first reflector is not opaque to radiation particles which are able to cause the first scintillator to emit photons when the radiation particles are incident on the first scintillator.

### Claim 5 (depends on 1)

The radiation detector of claim 1, wherein the first scintillator is essentially completely enclosed by the first reflector and the first pixel.

### Claim 6 (depends on 1)

The radiation detector of claim 1, further comprising:
a fourth reflector; and
a fourth scintillator,
wherein the fourth reflector is configured to guide essentially all photons emitted by the fourth scintillator into the first pixel.

### Claim 7 (depends on 1)

The radiation detector of claim 1, wherein the first scintillator comprises sodium iodide.

### Claim 8 (depends on 1)

The radiation detector of claim 1, wherein the first scintillator comprises quantum dots.

### Claim 9 (depends on 1)

The radiation detector of claim 1, wherein a portion of the first reflector is disposed on sidewalls of the recess.

### Claim 10 (depends on 1)

The radiation detector of claim 1, wherein a portion of the first reflector is disposed on an end wall of the recess.

### Claim 11 (depends on 1)

The radiation detector of claim 1, wherein the recess has a shape of a truncated pyramid.

### Claim 12 (depends on 1)

The radiation detector of claim 1, wherein the first substrate comprises silicon or silicon dioxide.

### Claim 13 (depends on 1)

The radiation detector of claim 1, further comprising a second substrate, wherein the first pixel is in the second substrate.

### Claim 14

A method, comprising:
forming a first recess into a surface of a first substrate;
forming a first reflector on walls of the first recess;
forming a first scintillator in the first recess;
forming a second recess into the surface of the first substrate;
forming a second reflector on walls of the second recess; and
forming a second scintillator in the second recess,
bonding a second substrate having a first pixel and a second pixel to the first substrate, wherein the first reflector is configured to guide essentially all photons emitted by the first scintillator into the first pixel;
wherein the second reflector is configured to guide essentially all photons emitted by the second scintillator into the second pixel;
wherein the first scintillator is in direct physical contact with the pixel;
wherein the first reflector is in direct physical contact with the second reflector.

### Claim 15 (depends on 14)

The method of claim 14, wherein the first reflector is in direct physical contact with the first scintillator.

### Claim 16 (depends on 14)

The method of claim 14, wherein the first reflector is configured to reflect photons emitted by the first scintillator toward the first reflector.

### Claim 17 (depends on 14)

The method of claim 14, wherein the first scintillator is essentially completely enclosed by the first reflector and the pixel.