Power amplifiers testing system and related testing method

A power amplifier, comprising:

• a first transforming circuit, arranged to generate a non-inverting input signal and an inverting input signal according to an input signal, wherein the first transforming circuit comprises:
• a first inductor, having a first terminal coupled to the input signal and a second terminal coupled to a first reference voltage level;
• and
• a second inductor, magnetically coupled to the first inductor, and having a first terminal and a second terminal for generating the non-inverting input signal and the inverting input signal according to the input signal respectively,
• wherein a first turns of the first inductor is greater than a second turns of the second inductor;
• a plurality of first circuit stages, coupled to the first transforming circuit, for generating an inverting output signal according to the non-inverting input signal;
• a plurality of second circuit stages, coupled to the first transforming circuit, for generating an non-inverting output signal according to the inverting input signal;
• and
• a second transforming circuit, coupled to the plurality of first circuit stages and the plurality of second circuit stages, for generating an output signal according to the inverting output signal and the non-inverting output signal, wherein the second transforming circuit comprises:
• a first inductor, having a first terminal and second terminal coupled to the non-inverting output signal and the inverting output signal respectively;
• and
• a second inductor, magnetically coupled to the first inductor, and having a first terminal outputted the output signal and a second terminal coupled to a first reference voltage,
• wherein a first turns of the first inductor is less than a second turns of the second inductor;
• wherein the plurality of first circuit stages are connected in parallel, and the plurality of second circuit stages are connected in parallel.

A testing method, comprising:

• arranging a signal generator to generate a testing signal;
• arranging a dividing circuit to receive the testing signal and generate a plurality of input signals according to the testing signal;
• and
• simultaneously testing a plurality of power-amplifier chips by arranging each of the plurality of power-amplifier chips to receive a respective input signal of the plurality of input signals and generate a respective output signal for a predetermined testing time.