# US 11,906,449 B2 · Mass spectrometer > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,906,449 B2 - Document ID: US11906449B2 - Status: Granted - Kind: B2 - Application number: 17/645,354 - Filed: 2021-12-21 - Published: 2022-07-28 - Granted: 2024-02-20 - Earliest claimed: 2021-01-28 - Assignees: Shimadzu Corporation - Applicants: Shimadzu Corporation - Inventors: Osamu Furuhashi; Junichi Taniguchi - Web page: https://patentgrep.com/patent/US11906449B2 ## CPC - G01N 23/20058: Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method - H01J 49/004: {Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn} - H01J 49/022: {Circuit arrangements, e.g. for generating deviation currents or voltages (regulating electric or magnetic variables in general, e.g. current, magnetic field G05F); Components associated with high voltage supply (high voltage supply per se H02M)} - H01J 49/025: {Detectors specially adapted to particle spectrometers (data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29)} - G01N 2223/101: electromagnetic radiation - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H) ## Abstract A mass spectrometer (1) includes: an ionization section (201) configured to generate ions from a sample; a mass separation section (231, 235) configured to separate ions generated by the ionization section according to mass-to-charge ratio; an ion detector (237) configured to detect an ion separated by the mass separation section; an ion capture section (31) configured to capture ions separated by the mass separation section; and an electron beam detection section (32) configured to detect an electron beam diffracted by ions captured within the ion capture section (31). This mass spectrometer is capable of performing, in a single measurement operation, both a mass spectrometric analysis and an electron-beam diffraction measurement for distinguishing between isomers. The electron-beam diffraction measurement can be more efficiently performed than in a conventional device of this type. ## Claims ### Claim 1 A mass spectrometer, comprising: an ionization section configured to generate ions from a sample; a mass separation section configured to separate ions generated by the ionization section according to mass-to-charge ratio; an ion detector configured to detect an ion separated by the mass separation section; an ion capture section configured to capture an ion separated by the mass separation section; and an auxiliary measurement section configured to measure a physical quantity of the ion captured by the ion capture section, where the physical quantity is different from mass-to-charge ratio; wherein the mass separation section includes: a front mass separation section configured to select, as a precursor ion, an ion having a specific mass-to-charge ratio from the ions generated by the ionization section; a dissociation section configured to dissociate the precursor ion into product ions; and a rear mass separation section configured to select an ion having a specific mass-to-charge ratio from the product ions. ### Claim 2 (depends on 1) The mass spectrometer according to claim 1, further comprising: a deflection section located between the mass separation section and the ion detector, and configured to receive ions from the mass separation section and deflect the ions in a different flight direction, wherein: the ion capture section is located on a flight path of the ions deflected by the deflection section. ### Claim 3 (depends on 1) The mass spectrometer according to claim 1, further comprising: a voltage application section configured to apply a rectangular voltage for capturing ions within the ion capture section. ### Claim 4 (depends on 1) The mass spectrometer according to claim 1, wherein the auxiliary measurement section includes: an irradiation section configured to irradiate ions captured within the ion capture section with electromagnetic waves or a particle beam; and a detection section configured to detect electromagnetic waves or a particle exiting from the ion capture section. ### Claim 5 (depends on 4) The mass spectrometer according to claim 4, wherein: the irradiation section is an electron-beam irradiation section configured to deliver an electron beam into the ion capture section; and the detection section is configured to detect the electron beam diffracted by the ion. ### Claim 6 (depends on 1) The mass spectrometer according to claim 1, further comprising: a voltage application section configured to apply a rectangular voltage for capturing ions within the ion capture section, wherein the auxiliary measurement section includes: an irradiation section configured to irradiate ions captured within the ion capture section with electromagnetic waves or a particle beam; and a detection section configured to detect electromagnetic waves or a particle exiting from the ion capture section, and wherein the irradiation section is configured to deliver the electromagnetic waves or particle beam in a pulsed form into the ion capture section when a rectangular voltage with a predetermined phase is applied from the voltage application section to the ion capture section. ### Claim 7 A mass spectrometer, comprising: an ionization section configured to generate ions from a sample; a mass separation section configured to separate ions generated by the ionization section according to mass-to-charge ratio; an ion detector configured to detect an ion separated by the mass separation section; an ion capture section configured to capture an ion separated by the mass separation section; an auxiliary measurement section configured to measure a physical quantity of the ion captured by the ion capture section, where the physical quantity is different from mass-to-charge ratio; wherein the auxiliary measurement section includes: an irradiation section configured to irradiate ions captured within the ion capture section with electromagnetic waves or a particle beam; and a detection section configured to detect electromagnetic waves or a particle exiting from the ion capture section; wherein the irradiation section is an electron-beam irradiation section configured to deliver an electron beam into the ion capture section; and the detection section is configured to detect the electron beam diffracted by the ion; a molecular structure candidate input reception section configured to receive an input of information of a molecular structure candidate; and a first molecular structure estimation section configured to estimate a molecular structure of a molecule contained in a sample by comparing an electron diffraction image obtained by a measurement of the sample and an electron diffraction image prepared for the molecular structure candidate. ### Claim 8 (depends on 7) The mass spectrometer according to claim 7, further comprising an electron diffraction image estimation section configured to estimate an electron diffraction image by a theoretical calculation based on a molecular structure received by the molecular structure candidate input reception section. ### Claim 9 A mass spectrometer, comprising: an ionization section configured to generate ions from a sample; a mass separation section configured to separate ions generated by the ionization section according to mass-to-charge ratio; an ion detector configured to detect an ion separated by the mass separation section; an ion capture section configured to capture an ion separated by the mass separation section; an auxiliary measurement section configured to measure a physical quantity of the ion captured by the ion capture section, where the physical quantity is different from mass-to-charge ratio; a voltage application section configured to apply a rectangular voltage for capturing ions within the ion capture section, wherein the auxiliary measurement section includes: an irradiation section configured to irradiate ions captured within the ion capture section with electromagnetic waves or a particle beam; and a detection section configured to detect electromagnetic waves or a particle exiting from the ion capture section; wherein the irradiation section is an electron-beam irradiation section configured to deliver an electron beam into the ion capture section; and the detection section is configured to detect the electron beam diffracted by the ion; wherein the electron beam irradiation section is configured to be capable of varying energy of the electron beam. ### Claim 10 (depends on 9) The mass spectrometer according to claim 9, further comprising a second molecular structure estimation section configured to estimate a structure of a sample molecule based on electron diffraction images obtained by irradiation with the electron beam with different amounts of energy. ### Claim 11 A mass spectrometer, comprising: an ionization section configured to generate ions from a sample; a mass separation section configured to separate ions generated by the ionization section according to mass-to-charge ratio; an ion detector configured to detect an ion separated by the mass separation section; an ion capture section configured to capture an ion separated by the mass separation section; an auxiliary measurement section configured to measure a physical quantity of the ion captured by the ion capture section, where the physical quantity is different from mass-to-charge ratio; a voltage application section configured to apply a rectangular voltage for capturing ions within the ion capture section, wherein the auxiliary measurement section includes: an irradiation section configured to irradiate ions captured within the ion capture section with electromagnetic waves or a particle beam; and a detection section configured to detect electromagnetic waves or a particle exiting from the ion capture section; wherein the irradiation section is an electron-beam irradiation section configured to deliver an electron beam into the ion capture section; and the detection section is configured to detect the electron beam diffracted by the ion; a third molecular structure estimation section configured to estimate a molecular structure of a sample molecule based on an electron diffraction image obtained by a measurement of a compound formed by bonding a previously determined kind of atom to a specific position of the sample molecule. ### Claim 12 (depends on 11) The mass spectrometer according to claim 11, further comprising a separation means configured to separate compounds contained in a sample before ions are mass-separated in the mass separation section. ### Claim 13 (depends on 12) The mass spectrometer according to claim 12, wherein the separation means is a chromatograph apparatus and/or an ion mobility spectrometer.