Architecture design and process for manufacturing monolithically integrated 3D CMOS logic and memory
AssigneeTokyo Electron Limited
InventorsLars Liebmann, Jeffrey Smith, Anton J. deVilliers, Kandabara Tapily
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AssigneeTokyo Electron Limited
InventorsLars Liebmann, Jeffrey Smith, Anton J. deVilliers, Kandabara Tapily
Estimating the term…
In a method of forming a semiconductor device, a plurality of transistor pairs is formed to be stacked over a substrate. The plurality of transistor pairs have a plurality of gate electrodes that are stacked over the substrate and electrically coupled to gate structures of the plurality of transistor pairs, and a plurality of source/drain (S/D) local interconnects that are stacked over the substrate and electrically coupled to source regions and drain regions of the plurality of transistor pairs. A sequence of vertical and lateral etch steps are performed to etch the plurality of the gate electrodes and the plurality of S/D local interconnects so that the plurality of the gate electrodes and the plurality of S/D local interconnects have a staircase configuration.
A method of forming a semiconductor device, comprising:
Dependencies are inferred from the claim text.