Multilayer substrate
AssigneeDexerials Corporation
InventorsSeiichiro Shinohara, Yasushi Akutsu, Tomoyuki Ishimatsu
Life of this patent
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Abstract
Provided is a multilayer substrate including laminated semiconductor substrates each having a penetrating hole (hereinafter referred to as through hole) having a plated film formed in the inner surface. The multilayer substrate has excellent conduction characteristics and can be manufactured at low cost. Conductive particles are selectively present at a position where the through holes face each other as viewed in a plan view of the multilayer substrate. The multilayer substrate has a connection structure in which the facing through holes are connected by the conductive particles, and the semiconductor substrates each having the through hole are bonded by an insulating adhesive.
Claims20
A multilayer substrate comprising:
- semiconductor substrates each having a through hole of a plurality of through holes and a plated film on an inner surface thereof, the semiconductor substrates being laminated to each other, wherein:
- a particle group formed from a plurality of adjacent conductive particles is present at least at a position where a first pair of the through holes face each other as viewed in a first direction corresponding to a plan view of the multilayer substrate, wherein each conductive particle in the particle group includes a metal coating and a core resin material, and
- the multilayer substrate has a connection structure in which the first pair of the through holes are connected by the particle group, and the semiconductor substrates are bonded together by an insulating adhesive, wherein
- a first conductive particle in the particle group includes a first surface directly contacting the insulating adhesive, the first surface protruding convexly towards the insulating adhesive as viewed in a second direction, and
- the second direction is perpendicular to the first direction.
A multilayer substrate comprising:
- semiconductor substrates each having a through hole of a plurality of through holes and a plated film on an inner surface thereof, the semiconductor substrates being laminated to each other, wherein:
- a particle group formed from a plurality of adjacent conductive particles is present at least at a position where a first pair of the through holes face each other as viewed in a first direction corresponding to a plan view of the multilayer substrate, and
- the multilayer substrate has a connection structure in which the first pair of the through holes are connected by the particle group, and the semiconductor substrates are bonded together by an insulating adhesive, wherein
- the conductive particles in the particle group are disposed in a plane direction of the insulating adhesive,
- a first conductive particle in the particle group includes a first surface directly contacting the insulating adhesive, the first surface protruding convexly towards the insulating adhesive as viewed in a second direction, and
- the second direction is perpendicular to the first direction.
A method for manufacturing a multilayer substrate in which through holes, each having a plated film on an inner surface thereof, are formed in semiconductor substrates which are faced and laminated to each other, the method comprising:
- putting a particle group between each of the semiconductor substrates, each semiconductor substrate having a through hole of the through holes, the particle group formed from a plurality of adjacent conductive particles, wherein each conductive particle in the particle group includes a metal coating and a core resin material, each conductive particle corresponding to a position where at least a first pair of the through holes face each other as viewed in a first direction corresponding to a plan view of the multilayer substrate such that the multilayer substrate has a connection structure in which the first pair of the through holes is connected by the particle group, and the semiconductor substrates are bonded together by an insulating adhesive anisotropic conductive film;
- and
- pressurizing the connection structure under heating to achieve an anisotropic conductive connection of the semiconductor substrates such that a first conductive particle in the particle group includes a first surface directly contacting the insulating adhesive and the first surface protrudes convexly towards the insulating adhesive as viewed in a second direction, wherein the second direction is perpendicular to the first direction.
Dependencies are inferred from the claim text.