Inspection device and method for operating inspection device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsMasumi Nomura, Seiichi Yoneda
Life of this patent
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsMasumi Nomura, Seiichi Yoneda
Estimating the term…
An inspection device having a plurality of functions is achieved. The performance of an inspection device is improved. A structure of an inspection device is simplified. A structure of an imaging device is simplified. The inspection device includes a light source having a function of emitting infrared light, a light source having a function of emitting visible light, and an imaging portion which are provided over a substrate having flexibility, and inspects a fruit or vegetable. A first image based on light including reflected light of the infrared light, and a second image and a third image based on tight including reflected light of the visible light are captured by the imaging portion. The inspection device has a function of detecting one or more of the sugar content, the acidity, and a physiological disorder of a fruit or vegetable on the basis of the first image. The inspection device has a function of detecting at least one of the color and a scratch of a surface of the fruit or vegetable on the basis of the second image. The inspection device has a function of determining the grade of the fruit or vegetable on the basis of the first image and the second image. The inspection device has a function of detecting the size of the fruit or vegetable and determining the class on the basis of the third image.
An inspection device comprising:
A method for operating an inspection device, comprising the steps of:
Dependencies are inferred from the claim text.