Enhanced auxiliary memory mapped interface test systems and methods

An enhanced auxiliary interface test method comprising:

• coupling a plurality of devices under test (DUTs) to a loadboard;
• testing the plurality of DUTs coupled to the loadboard;
• configuring multiple paths for access to a central processing unit (CPU) and testing the plurality of DUTs in parallel, wherein the configuring utilizes a flexible enhanced auxiliary interface;
• modifying a field programmable gate array (FPGA), a driver, and a user space to support the flexible enhanced auxiliary interface;
• and
• directing testing of the plurality of DUTs in accordance with the multiple paths.

An enhanced auxiliary interface test system comprising:

• a load board configured to couple with a plurality of devices under test (DUTs);
• testing electronics configured to test the plurality of NVMe devices with a universal asynchronous receiver-transmitter (UART) interface, wherein the testing electronics are coupled to the load board;
• a controller configured to direct testing of the DUTs, wherein the controller is coupled to the testing electronics;
• and
• a flexible enhanced auxiliary interface configured to implement multiple paths to access a central processing unit (CPU) on the controller and enable testing of multiple NVMe devices in parallel, wherein the flexible enhanced auxiliary interface is supported by modifications to a field programmable gate array (FPGA), a driver, and a user space.