System for testing electrical connections between components

A test system for an electrical system, the test system comprising:

• a body comprising an enclosure defining an internal volume, wherein the body comprises a slot array comprising a plurality of slots and a plurality of recesses formed therethrough, and each slot of the plurality of slots is aligned with a corresponding recess of the plurality of recesses;
• a mount disposed within the internal volume,
• wherein the mount is positioned within a recess of the plurality of recesses;
• and,
• wherein the mount is aligned with a slot and is configured to receive an additional conductor inserted through the slot;
• a connector port comprising a plurality of pins;
• a conductor extending within the internal volume, wherein the conductor is electrically coupled to a pin of the plurality of pins and is inserted into the mount;
• a device holder removably coupled to the body via a fastener configured to extend through the device holder and the body, wherein the device holder defines a space configured to receive a test device for testing an electrical connection of the electrical system.

A test system for an electrical system, the test system comprising:

• a body comprising a slot array, wherein the slot array comprises a plurality of slots and a plurality of recesses;
• a plurality of mounts,
• wherein a mount of the plurality of mounts is positioned within a respective recess of the plurality of recesses to align with a respective slot of the plurality of slots;
• and
• a connector port comprising a plurality of pins;
• a plurality of conductors, wherein a conductor of the plurality of conductors is electrically coupled to a respective pin of the plurality of pins and extends into the mount of the plurality of mounts;
• and
• a device holder comprising
• a base configured to couple to the body, wherein the device holder defines a space configured to receive a test device for testing an electrical connection of the electrical system and;
• a backing adjustably coupled to the base, wherein the backing is configured to move relative to the base to adjust a size of the space defined by the device holder;
• wherein the mount of the plurality of mounts is configured to receive an additional conductor of the test device via a corresponding slot of the plurality of slots to electrically couple the additional conductor to a corresponding pin of the plurality of pins via the conductor of the plurality of conductors.