Configuration of configurable test logic

A programmable device comprising:

• a collection of storage elements to store configuration information for configuring a configurable test logic of a computing device that is separate from the programmable device;
• a controller to:
• while the computing device is held in reset, detect an indication to enter a test mode;
• indicate to the computing device that the computing device is to enter the test mode;
• select a subset of the configuration information from the collection of storage elements;
• send an indication to the computing device to cause release of the computing device from reset;
• and
• send the subset of the configuration information through an interface to the computing device, to cause loading of the subset of the configuration information into a collection of computing device storage elements that is part of a first reset domain of the computing device when the computing device is released from reset, the first reset domain of the computing device being independent of a second reset domain when the computing device is in the test mode, and the subset of the configuration information loaded into the collection of computing device storage elements for use in configuring the configurable test logic of the computing device to perform a test measurement of a subsystem in the second reset domain of the computing device.

A method comprising:

• while a computing device is in reset, detecting, by a control device, receipt of a test mode activation input that indicates the computing device is to enter a test mode;
• retrieving, by the control device from a first collection of storage elements in the control device, configuration information for configuring test logic in the computing device in the test mode;
• releasing, by the control device, the computing device from reset;
• providing, from the control device to the computing device, a test mode indicator and the configuration information;
• in response to being released from reset, receiving, at a second collection of storage elements in the computing device, the configuration information, the second collection of storage elements being part of a first reset domain that is independent of a second reset domain in the computing device;
• after parsing the configuration information received in the second collection of storage elements, providing, by a controller in the first reset domain of the computing device, an indication to release the second reset domain from reset;
• loading the configuration information after the parsing into the test logic;
• and
• performing, by the test logic, test operations according to the configuration information.