Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
AssigneeAdvantest Corporation
InventorMarc Mössinger
Life of this patent
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Abstract
An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.
Claims19
An automated test equipment for testing one or more devices under test, the automated test equipment comprising:
- a device-under-test interface comprising a plurality of blocks of spring-loaded pins configured to electrically contact a device-under-test board;
- a hinge;
- a test head configured to couple said device-under-test interface to a test instrument,
- wherein at, least one block or spring-loaded pins of the plurality of blocks or spring-loaded pins is guided using the hinge, and
- wherein a distance between a first and a second block of the plurality of blocks of spring-loaded pins is adjustable.
An apparatus comprising:
- a plurality of blocks of spring-loaded pins having an axis of travel,
- wherein the plurality of blocks of spring-loaded pins are operable to electrically couple a test head to a device under test board;
- and
- a mechanism to vary a distance, perpendicular to said axis of travel, between at least two blocks of said plurality of blocks of spring-loaded pins,
- wherein said mechanism comprises a hinge.
A method for operating an automated test equipment for testing one or more devices under test, the automated test equipment comprising a device-under-test interface, wherein the device-under-test interface comprises a plurality of blocks of spring-loaded pins, the method comprising:
- coupling one block of said plurality of blocks of spring-loaded pins to a first device under test board;
- varying, using a hinge, a distance between at least two blocks of spring-loaded pins of the device under-test interface;
- and
- coupling the one block of said plurality of blocks of spring-loaded pins to a second device under test board subsequent to said varying.
Dependencies are inferred from the claim text.