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US 11,899,042 B2Granted
Automated test system
AssigneeTeradyne, Inc.
InventorsPhilip Luke Campbell, Adnan Khalid, Christopher Croft Jones, Christopher James Bruno
Life of this patent
Estimating the term…
Abstract
An example test system includes test sites comprising test sockets for testing devices under test (DUTs) and pickers for picking DUTs from the test sockets or placing the DUTs into the test sockets. Each picker may include a picker head for holding a DUT. The test system also includes a gantry on which the pickers are mounted. The gantry may be configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the test sockets or placing the DUTs into the test sockets. The test sockets are arranged in at least one array that is accessible to the pickers on the gantry.
Claims24
A test system comprising:
- test sites comprising test sockets for testing devices under test (DUTs);
- Dickers for picking DUTs from the test sockets or placing the DUTs into the test sockets, each picker comprising a picker head for holding a DUT;
- a gantry on which the pickers are mounted, the gantry being configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the test sockets or placing the DUTs into the test sockets;
- and
- packs comprising the test sockets and at least some test electronics for performing tests on the DUTs in the test sockets, where different packs are configurable to have different configurations for DUTs having different characteristics;
- wherein the test sockets are arranged in at least one array that is accessible to the pickers on the gantry;
- and
- wherein the pickers are controllable, and a number of the pickers is scalable, based on characteristics of the packs and the test sockets in the packs.
5 more elements
A test system comprising:
- test sites comprising test sockets for testing devices under test (DUTs);
- pickers for picking DUTs from the test sockets or placing the DUTs into the test sockets, each picker comprising a picker head for holding a DUT;
- a gantry on which the pickers are mounted, the gantry being configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the test sockets or placing the DUTs into the test sockets;
- and
- packs comprising the test sockets and at least some test electronics for performing tests on the DUTs in the test sockets, where different packs are configurable to have different configurations, the different configurations comprising at least different numbers of test sockets arranged at different pitches;
- wherein the test sockets are arranged in at least one array that is accessible to the pickers on the gantry;
- wherein the gantry comprises a beam that spans across the at least one array of test sockets and that is configured to move over the at least one array of test sockets in a direction perpendicular to the beam;
- and
- wherein the pickers are arranged linearly along the beam and are configured to move linearly along the beam;
- wherein the pickers are controllable to move linearly along the beam to change a pitch of the pickers along the beam;
- wherein the pickers are controllable to move linearly along the beam to change the pitch while the beam moves over the at least one array of test sockets in the direction perpendicular to the beam;
- and
- wherein the pickers are controllable to move linearly along the beam to change the pitch to match pitches of different sets of test sockets in different packs installed in the test system.
10 more elements
A test system comprising:
- test sites comprising test sockets for testing devices under test (DUTs);
- Dickers for picking DUTs from the test sockets or placing the DUTs into the test sockets, each picker comprising a picker head for holding a DUT;
- and
- a gantry on which the pickers are mounted, the gantry being configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the test sockets or placing the DUTs into the test sockets;
- wherein the test sockets are arranged in at least one array that is accessible to the pickers on the gantry;
- wherein the gantry is a main gantry;
- and
- wherein the test system further comprises:
- a LASER cleaning assembly;
- and
- an auxiliary gantry built onto a same bearing system as the main gantry, the LASER cleaning assembly being connected to the auxiliary gantry, the auxiliary gantry being configured to move the LASER cleaning assembly relative to the test sockets in order to clean the test sockets using LASER light.
8 more elements
Dependencies are inferred from the claim text.