Electron spectrometer
AssigneeTohoku University
InventorsMasahiko Takahashi, Isao Nakajima, Yuuki Onitsuka
Life of this patent
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AssigneeTohoku University
InventorsMasahiko Takahashi, Isao Nakajima, Yuuki Onitsuka
Estimating the term…
The electron spectrometer includes an excitation part 100 irradiating a sample with an energy beam, an orbiting part 10 causing electrons emitted from the sample irradiated with the energy beam to orbit, and a detection part 120 detecting the electrons released from the orbiting part 10, in which the orbiting part 10 includes a plurality of pairs of electrodes, the plurality of pairs of electrodes cause the electrons to orbit when an applied voltage is controlled, a part of the plurality of pairs of electrodes are pairs of electrodes to catch which catch the electrons into the orbiting part 10 when an applied voltage is controlled, and a part of the plurality of pairs of electrodes are pairs of electrodes to release which release the electrons from the orbiting part 10 when an applied voltage is controlled.
An electron spectrometer comprising:
The electron spectrometer according to 2, wherein
The electron spectrometer according to 3, wherein
Dependencies are inferred from the claim text.