Real-equivalent-time oscilloscope with time domain reflectometer

Abstract

A test and measurement device includes one or more ports configured to connect to a device under test (DUT), a time domain reflectometry (TDR) source configured receive a source control signal and to produce an incident signal to be applied to the DUT, one or more analog-to-digital converters (ADC) configured to receive a sample clock and sample the incident signal from the TDR source and a time domain reflection (TDR) signal or a time domain transmission (TDT) signal from the DUT to produce an incident waveform and a TDR/TDT waveform, one or more processors configured to execute code to cause the one or more processors to: control a clock synthesizer to produce the sample clock and the source control signal, and use a period of the TDR source, a period of the sample clock, and the number of samples to determine time locations for samples in the incident waveform and the TDR/TDT waveform, and a display configured to display the incident waveform and the TDR/TDT waveform. A method of sampling a waveform using a real-equivalent-time oscilloscope having a time domain reflectometry source, comprising: controlling a clock synthesizer to produce a sample clock and a source control signal; using a time domain reflectometry (TDR) source to receive the source control signal and to produce an incident signal to be applied to a device under test (DUT); receiving the sample clock at one or more analog-to-digital converters (ADC) and sampling the incident signal from the TDR source and a TDR/TDT signal from the DUT to produce an incident waveform and a TDR/TDT waveform; determining time locations for samples in the incident waveform and the TDR/TDT waveform, using a period of the TDR source, a period of the sample clock, and a number of samples; and displaying the incident waveform and the TDR/TDT waveform.

Dependencies are inferred from the claim text.