Measurement system and measurement method

A measurement method for characterizing a device under test, wherein the device under test is established as an RF-to-digital device comprising an analog input, or wherein the device under test is established as a digital-to-RF device comprising a digital input, comprising:

• generating a digital instruction signal or an analog stimulus signal for the device under test by a signal source;
• in the case of generating the analog stimulus signal by the signal source, forwarding the analog stimulus signal to the device under test by a directional element, generating a digital output signal based on the analog stimulus signal by the device under test, and forwarding the digital output signal to an analysis module;
• in the case of generating the digital instruction signal by the signal source, forwarding the digital instruction signal to the device under test, generating an analog output signal based on the digital instruction signal by the device under test, and forwarding the analog output signal to the analysis module via the directional element;
• and
• determining, by the analysis module, at least one characteristic parameter of the device under test based on the analog output signal of the device under test or the digital output signal of the device under test.

A measurement system for characterizing a device under test, comprising:

• a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module,
• wherein the device under test is established as an RF-to-digital device comprising an analog input, or wherein the device under test is established as a digital-to-RF device comprising a digital input;
• wherein the signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test;
• wherein, in the case of generating the analog stimulus signal by the signal source, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test is configured to generate a digital output signal based on the analog stimulus signal received, wherein the digital output signal is forwarded to the analysis module;
• wherein, in the case of generating the digital instruction signal by the signal source, the device under test is configured to generate an analog output signal based on the digital instruction signal received, wherein the directional element is configured to forward the analog output signal generated to the analysis module;
• wherein the analysis module includes circuitry configured to determine at least one characteristic parameter of the device under test based on the analog output signal of the device under test or the digital output signal of the device under test;
• wherein the device under test has a transmitting mode;
• wherein the signal source is configured to generate an analog test signal if the device under test is in the transmitting mode, wherein the directional element is configured to forward the analog test signal to the analog input of the device under test;
• wherein the analog test signal is separable from the analog output signal of the device under test;
• and
• wherein the analog test signal is orthogonal to the analog output signal, thereby ensuring the separability of the analog test signal and the analog output signal.