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US 11,894,671 B2Granted
Electrical over stress protection device
AssigneeNanya Technology Corporation
InventorChang-Ting Wu
Life of this patent
Estimating the term…
Abstract
An electrical over stress protection device is provided. A detection circuit detects an input voltage from a pad, provides a first discharge path when the input voltage is higher than a preset voltage, and provides a turn-on voltage to a discharge protection circuit to control the discharge protection circuit to provide at least one second discharge path.
Claims10
An electrical over stress (EOS) protection device, configured to protect an internal circuit of a chip, and the internal circuit receiving an input voltage through a pad, the EOS protection device, comprising:
- a first protection resistor circuit, coupled to the pad of the chip;
- a detection circuit, coupled to the first protection resistor circuit, detecting the input voltage, and providing a turn-on voltage when the input voltage is higher than a preset voltage;
- a voltage divider circuit, coupled to the detection circuit and a ground terminal, and the first protection resistor circuit, the detection circuit, and the voltage divider circuit forming a first discharge path when the input voltage is higher than the preset voltage;
- and
- a discharge protection circuit, coupled to the pad, the detection circuit, and the ground terminal, and providing at least one second discharge path according to the turn-on voltage.
2 more elements
Dependencies are inferred from the claim text.