Temperature-dependent word line voltage and discharge rate for refresh read of non-volatile memory
AssigneeSanDisk Technologies LLC
InventorsDong-Il Moon, Abhijith Prakash, Wei Zhao, Henry Chin
Life of this patent
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AssigneeSanDisk Technologies LLC
InventorsDong-Il Moon, Abhijith Prakash, Wei Zhao, Henry Chin
Estimating the term…
A memory apparatus and method of operation are provided. The apparatus includes memory cells each connected to one of a plurality of word lines. The memory cells are disposed in strings and configured to retain a threshold voltage corresponding to one of a plurality of data states. A control means is coupled to the plurality of word lines and the strings and is configured to apply a read voltage to a selected ones of the plurality of word lines during a read operation and ramp down to a discharge voltage at an end of the read operation and apply a ready voltage to the selected ones of the plurality of word lines during a ready period of time following the read operation. The control means is also configured to adjust at least one of the discharge voltage and the ready voltage based on a temperature of the memory apparatus.
A memory apparatus, comprising:
A controller in communication with a memory apparatus including memory cells each connected to one of a plurality of word lines and disposed in strings and configured to retain a threshold voltage corresponding to one of a plurality of data states, the controller configured to:
A method of operating a memory apparatus including memory cells each connected to one of a plurality of word lines and disposed in strings and configured to retain a threshold voltage corresponding to one of a plurality of data states, the method comprising the steps of:
Dependencies are inferred from the claim text.