Image sticking test method and image sticking test device

An image sticking test method, comprising:

• acquiring a first correspondence between a source-drain current of a preset drive transistor and time within a first preset time after a voltage of the preset drive transistor in an array substrate is switched from a first preset voltage to a second preset voltage;
• acquiring a second correspondence between a source-drain current of the preset drive transistor and time within a second preset time after the voltage of the preset drive transistor is switched from a third preset voltage to the second preset voltage;
• and
• acquiring a first image sticking test curve of the array substrate according to the first correspondence, the second correspondence and an image sticking evaluation formula, wherein the first image sticking test curve is a correspondence between time and an image sticking evaluation value,
• wherein the image sticking evaluation formula is
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• wherein I(t)JND denotes an image sticking evaluation value of the array substrate at moment t after the voltage of the preset drive transistor is switched;
• I(t)A denotes a source-drain current of the preset drive transistor at the moment t after the voltage of the preset drive transistor is switched from the first preset voltage to the second preset voltage;
• I(t)B denotes a source-drain current of the preset drive transistor at the moment t after the voltage of the preset drive transistor is switched from the third preset voltage to the second preset voltage;
• I0A is a source-drain current of the preset drive transistor at the first preset voltage;
• and I0B is a source-drain current of the preset drive transistor at the third preset voltage.

An image sticking test device, the image sticking device configured to:

• acquire a first correspondence between a source-drain current of a preset drive transistor and time within a first preset time after a voltage of the preset drive transistor in an array substrate is switched from a first preset voltage to a second preset voltage;
• acquire a second correspondence between a source-drain current of the preset drive transistor and time within a second preset time after the voltage of the preset drive transistor is switched from a third preset voltage to the second preset voltage;
• and
• acquire a first image sticking test curve of the array substrate according to the first correspondence, the second correspondence and an image sticking evaluation formula, wherein the first image sticking test curve is a correspondence between time and an image sticking evaluation value,
• wherein the preset drive transistor is a drive transistor in an electrical thin-film transistor test group located in a non-active area of the array substrate.