Defect detection apparatus and medium
AssigneeNikon-Trimble Co., Ltd.
InventorYuichi Ohshima
Life of this patent
Estimating the term…
Abstract
A defect detection apparatus includes a defect detection unit and a calculation unit. The defect detection unit detects a defect that appears on an external appearance of a structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure with a surveying instrument. The calculation unit calculates defect data relating to the defect detected by the defect detection unit by using coordinate data that is correlated with the external appearance image data.
Claims22
A defect detection apparatus comprising:
- a measurement surface definition unit that defines a measurement surface based on angle and distance measurements associated with at least a first observation point and a second observation point on an external appearance of a structure, wherein the angle and distance measurements are relative to a surveying instrument and obtained with the surveying instrument;
- a defect detection unit that detects a structural defect of the structure that appears on the external appearance of the structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure in the defined measurement surface with the surveying instrument, wherein the defect detection unit includes a first imaging unit and a second imaging unit, and wherein the defect detection unit detects the structural defect of the structure by analyzing an image obtained by the first imaging unit or the second imaging unit and measuring a contrast in the image;
- and
- a calculation unit that:
- obtains angles of a third observation point corresponding to a reference position in the external appearance image data;
- converts at least one position, other than the reference position, in the external appearance image data into coordinate data based on the obtained angles and the defined measurement surface;
- and
- calculates defect data relating to the detected structural defect based on a portion of the coordinate data corresponding to a portion of the external appearance image data associated with the detected structural defect.
A non-transitory computer-readable storage medium comprising a program stored thereon, the program, when executed by circuitry, being configured to cause the circuitry to:
- define a measurement surface based on angle and distance measurements associated with at least a first observation point and a second observation point on an external appearance of a structure, wherein the angle and distance measurements are relative to a surveying instrument and obtained with the surveying instrument;
- detect a structural defect of the structure that appears on the external appearance of the structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure in the defined measurement surface with the surveying instrument, wherein the surveying instrument includes a first imaging unit and a second imaging unit, and wherein the defect detection unit detects the structural defect of the structure by analyzing an image obtained by the first imaging unit or the second imaging unit and measuring a contrast in the image;
- obtain angles of a third observation point corresponding to a reference position in the external appearance image data;
- convert at least one position, other than the reference position, in the external appearance image data into coordinate data based on the obtained angles and the defined measurement surface;
- and
- calculate defect data relating to the detected structural defect based on a portion of the coordinate data corresponding to a portion of the external appearance image data associated with the detected structural defect.
Dependencies are inferred from the claim text.