Method, device and system for testing memory devices
AssigneeChangxin Memory Technologies, Inc.
InventorsXinwang Chen, Maosong Ma, Jianbin Liu
Life of this patent
Estimating the term…
Abstract
The present disclosure provides a method, device and system for testing memory devices. The testing method includes: receiving a test instruction, the test instruction being used to characterize a model of a memory device to be tested that is connected to a test platform; selecting, according to the test instruction, a testing method corresponding to the model of the memory device to be tested from a plurality of pre-stored testing methods as a target testing method; and executing the target testing method to test the memory device to be tested.
Claims14
A method for testing memory devices, the method comprising:
- receiving a test instruction, the test instruction being used to characterize a model of a memory device to be tested that is connected to a test platform;
- selecting, according to the test instruction, a testing method corresponding to the model of the memory device to be tested from a plurality of pre-stored testing methods as a target testing method;
- and
- executing the target testing method to test the memory device to be tested.
A device for testing memory devices, the device comprising:
- one or more processors;
- and
- a storage apparatus, configured to store one or more programs, wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to execute operations of:
- receiving a test instruction, the test instruction being used to characterize a model of a memory device to be tested that is connected to a test platform;
- selecting, according to the test instruction, a testing method corresponding to the model of the memory device to be tested from a plurality of pre-stored testing methods as a target testing method;
- and
- executing the target testing method to test the memory device to be tested.
A system for testing memory devices, the system comprising a test platform, at least two test seats being arranged on the test platform, the at least two test seats being used for installation of memory devices to be tested, and the system further comprising a device for testing memory devices, the device comprising:
- one or more processors;
- and
- a storage apparatus, configured to store one or more programs, wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to execute operations of:
- receiving a test instruction, the test instruction being used to characterize a model of a memory device to be tested that is connected to a test platform;
- selecting, according to the test instruction, a testing method corresponding to the model of the memory device to be tested from a plurality of pre-stored testing methods as a target testing method;
- and
- executing the target testing method to test the memory device to be tested.
Dependencies are inferred from the claim text.