Generation of an issue detection evaluation regarding a system aspect of a system
AssigneeUncommonX Inc.
InventorsRaymond Hicks, Ryan Michael Pisani, Thomas James McNeela
Life of this patent
Estimating the term…
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AssigneeUncommonX Inc.
InventorsRaymond Hicks, Ryan Michael Pisani, Thomas James McNeela
Estimating the term…
A method includes determining, by an analysis system, a system aspect of a system for an issue detection evaluation. The method further includes determining, by the analysis system, at least one evaluation perspective for use in performing the issue detection evaluation on the system aspect. The method further includes determining, by the analysis system, at least one evaluation viewpoint for use in performing the issue detection evaluation on the system aspect. The method further includes obtaining, by the analysis system, issue detection data regarding the system aspect in accordance with the at least one evaluation perspective and the at least one evaluation viewpoint. The method further includes calculating, by the analysis system, an issue detection rating as a measure of system issue detection maturity for the system aspect based on the issue detection data, the at least one evaluation perspective, the at least one evaluation viewpoint, and at least one evaluation rating metric.
A method comprises:
A non-transitory computer readable memory comprises:
Dependencies are inferred from the claim text.