Testing electronic products for determining abnormality
AssigneeTriple Win Technology(Shenzhen) Co. Ltd.
InventorJia-Liang Wu
Life of this patent
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Abstract
A method for testing electronic products implemented in an electronic device includes selecting a serial port connected with a slave device in serial communication with a product under test. An activation instruction is transmitted to the slave device, and the electronic product is started through the slave device. Data stored in at least one register of the electronic product and a state of the electronic product is obtained and a capacitance of at least one capacitor in the electronic product is measured. When the electronic product is found to be in an abnormal state, determining a cause of abnormality according to data of the electronic product and the capacitance of the at least one capacitor.
Claims20
An electronic device comprising:
- at least one processor;
- and
- a storage device coupled to the at least one processor and storing instructions for execution by the at least one processor to cause the at least one processor to:
- select a serial port connected with a slave device, and communicate with an electronic product through the serial port;
- transmit an activation instruction to the slave device, and start the electronic product through the slave device;
- obtain data stored in at least one register of the electronic product and a state of the electronic product;
- measure a capacitance of at least one capacitor in the electronic product;
- and
- in response that the electronic product is in an abnormal state, determine a cause of abnormality according to obtained data of the electronic product and the capacitance of the at least one capacitor.
A method for testing electronic products implemented in an electronic device comprising:
- selecting a serial port connected with a slave device, and communicating with an electronic product through the serial port;
- transmitting an activation instruction to the slave device, and starting the electronic product through the slave device;
- obtaining data stored in at least one register of the electronic product and a state of the electronic product;
- measuring a capacitance of at least one capacitor in the electronic product;
- and
- in response that the electronic product is in an abnormal state, determining a cause of abnormality according to obtained data of the electronic product and the capacitance of the at least one capacitor.
A non-transitory computer-readable storage medium having instructions stored thereon, when the instructions are executed by a processor of an electronic device, the processor is configured to perform a method for testing electronic products, wherein the method comprises:
- selecting a serial port connected with a slave device, and communicating with an electronic product through the serial port;
- transmitting an activation instruction to the slave device, and starting the electronic product through the slave device;
- obtaining data stored in at least one register of the electronic product and a state of the electronic product;
- measuring a capacitance of at least one capacitor in the electronic product;
- and
- in response that the electronic product is in an abnormal state, determining a cause of abnormality according to obtained data of the electronic product and the capacitance of the at least one capacitor.
Dependencies are inferred from the claim text.