Communication node to interface between evaluation systems and a manufacturing system
AssigneeApplied Materials, Inc.
InventorsMichael Howells, Thorsten Kril, Hemanth Konanur Nagendra, Jatinder Sasan
Life of this patent
Estimating the term…
Loading patent…
AssigneeApplied Materials, Inc.
InventorsMichael Howells, Thorsten Kril, Hemanth Konanur Nagendra, Jatinder Sasan
Estimating the term…
An electronic device manufacturing system that includes a process tool and a tool server coupled to the process tool and comprising a communication node and an evaluation system. The communication node is configured to obtain one or more attributes from an evaluation system and provide a monitoring device comprising a data collection plan that is based on the one or more attributes. The communication node is further configured to register the monitoring device with a process tool. The communication node is further configured to receive, from the process tool, data based on the data collection plan and send the received data to the evaluation system.
An electronic device manufacturing system, comprising:
A method, comprising:
Dependencies are inferred from the claim text.