Semiconductor device with contact check circuitry
AssigneeElite Semiconductor Microelectronics Technology Inc.
InventorTse-Hua Yao
Life of this patent
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Abstract
A semiconductor device with contact check circuitry is provided. The semiconductor device includes a plurality of pads, an internal circuit, and a contact check circuit. The plurality of pads includes a first pad and a second pad. The internal circuit is coupled to the plurality of pads. The contact check circuit, at least coupled to the first pad and the second pad, is used for checking, when the semiconductor device is under test, contact connections to the first pad and the second pad to generate a check result signal according to comparison of a first test signal and a second test signal received from the first pad and the second pad with at least one reference signal.
Claims7
A semiconductor device with contact check circuitry, comprising:
- a plurality of pads including a first pad and a second pad;
- a voltage detection circuit, coupled to the first pad and the second pad, for generating at least one voltage detection signal;
- wherein the at least one voltage detection signal includes a first voltage detection signal and a second voltage detection signal, and the voltage detection circuit comprises:
- a first voltage divider, coupled between the first pad and a first power supply terminal, for generating the first voltage detection signal;
- and
- a second voltage divider, coupled between a second power supply terminal and the second pad, for generating the second voltage detection signal;
- an internal circuit coupled to the plurality of pads;
- and
- a contact check circuit, at least coupled to the first pad and the second pad, for comparing a first test signal received from the first pad and at least one reference signal and comparing a second test signal received from the second pad and at least one reference signal and then generating a check result signal according to these comparisons.
Dependencies are inferred from the claim text.