# US 11,892,492 B2 · Multi-axis test equipment > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,892,492 B2 - Document ID: US11892492B2 - Status: Granted - Kind: B2 - Application number: 17/516,633 - Filed: 2021-11-01 - Published: 2023-05-04 - Granted: 2024-02-06 - Earliest claimed: 2021-11-01 - Assignees: Milliwave Silicon Solutions, Inc. - Applicants: Milliwave Silicon Solutions, Inc. - Inventors: JeanMarc Laurent; Chinh Doan - Web page: https://patentgrep.com/patent/US11892492B2 ## CPC - G01R 29/10: Radiation diagrams of antennas - G01R 29/0871: {Complete apparatus or systems; circuits, e.g. receivers or amplifiers (G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857)} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract Embodiments herein relate to a testing apparatus for coupling with a device-under-test (DUT). The apparatus may include a base portion configured to couple to a testing platform, wherein the base portion is configured to rotate the DUT around a first axis. The apparatus may further include an arm portion configured to rotate the DUT around a second axis perpendicular to the first axis. The apparatus may further include a platform portion configured to couple to the DUT. Other embodiments may be described and claimed. ## Claims ### Claim 1 A testing apparatus for coupling with a device-under-test (DUT), wherein the apparatus comprises: a base portion configured to couple to a surface wherein the base portion is configured to rotate the DUT around a first axis; an arm portion coupled with the base portion, wherein the arm portion is configured to rotate the DUT around a second axis perpendicular to the first axis; and a platform portion coupled to the arm portion, wherein the platform portion is configured to couple to the DUT such that at least a portion of the DUT remains approximately at an intersection of the first and second axes; wherein a width of the arm portion is selectively adjustable based on a size of the DUT, and wherein the width of the arm portion is measured in a direction parallel to the second axis. ### Claim 2 (depends on 1) The testing apparatus of claim 1, wherein the width of the arm portion is adjustable based on the insertion or removal of a spacer between elements of the arm portion. ### Claim 3 (depends on 2) The testing apparatus of claim 2, wherein the spacer includes a passthrough hole configured to allow a wire that is to be communicatively coupled to the DUT to pass through from one side of the spacer to another side of the spacer. ### Claim 4 (depends on 1) The testing apparatus of claim 1, wherein an element of the platform portion includes a passthrough hole configured to allow a wire that is to be communicatively coupled to the DUT to pass through from one side of the element of the platform portion to another side of the element of the platform portion. ### Claim 5 (depends on 4) The testing apparatus of claim 4, wherein the passthrough hole is adjacent to an area where the arm portion is coupled with the platform portion. ### Claim 6 (depends on 1) The testing apparatus of claim 1, wherein the platform portion includes an attachment plate that is to couple to the DUT. ### Claim 7 (depends on 6) The testing apparatus of claim 6, wherein the attachment plate includes an actuator that is to rotate the DUT around a third axis that is perpendicular to the first and second axes. ### Claim 8 (depends on 1) The testing apparatus of claim 1, wherein the platform portion is adjustable such that an element of the platform portion that is to attach to the DUT is movable along a third axis that is perpendicular to the first and second axes. ### Claim 9 An apparatus comprising: a testing platform; and a testing apparatus to couple to a device-under-test (DUT) that includes a millimeter-wave (mmWave) antenna or a terahertz (THz)-frequency antenna, wherein the apparatus comprises: a base portion coupled to the testing platform, wherein the base portion is configured to rotate the DUT around an Azimuth axis; an arm portion coupled to the base portion, wherein the arm portion has a width that is selectively adjustable based on a size of the DUT, wherein the width is measured parallel to an Elevation axis that is perpendicular to the Azimuth axis, and wherein the arm portion is configured to rotate the DUT around the Elevation axis; and a platform portion coupled with the base portion, wherein the platform portion is configured to couple to the DUT, wherein the platform portion is configured to rotate the DUT around a Polarization axis that is perpendicular to the Elevation axis and the Azimuth axis, wherein the Polarization axis is coincident with an axis of radiation of the DUT, and wherein the platform portion is adjustable such that an element of the platform portion that is to attach to the DUT is movable along the Polarization axis. ### Claim 10 (depends on 9) The apparatus of claim 9, wherein an element of the arm portion includes a passthrough hole configured to allow a wire that is to be communicatively coupled to the DUT to pass through from one side of the element of the arm portion to another side of the element of the arm portion. ### Claim 11 (depends on 9) The apparatus of claim 9, wherein an element of the platform portion includes a passthrough hole configured to allow a wire that is to be communicatively coupled to the DUT to pass through from one side of the element of the platform portion to another side of the element of the platform portion. ### Claim 12 (depends on 9) The apparatus of claim 9, wherein the platform portion includes an attachment plate that is to couple to the DUT. ### Claim 13 A testing apparatus for coupling with a device-under-test (DUT), wherein the apparatus comprises: a base portion configured to couple to a surface, wherein the base portion is configured to rotate the DUT around a first axis; an arm portion coupled to the base portion, the arm portion configured to rotate the DUT around a second axis perpendicular to the first axis; and a platform portion coupled to the arm portion, the platform portion configured to couple to the DUT and rotate the DUT around a third axis that is perpendicular to the first and second axis and coincident with the axis of radiation of the DUT, and wherein the platform portion is adjustable such that an element of the platform portion that is to attach to the DUT is movable along the third axis. ### Claim 14 (depends on 13) The testing apparatus of claim 13, wherein the arm portion has a selectively adjustable width as measured in a direction parallel to the second axis, and wherein the width is adjustable based on a size of the DUT. ### Claim 15 (depends on 13) The testing apparatus of claim 13, wherein the width of the arm portion is adjustable based on the insertion or removal of a shim between an element of the arm portion and the platform portion. ### Claim 16 (depends on 13) The testing apparatus of claim 13, wherein an element of the platform portion includes a passthrough hole configured to allow a wire that is to be communicatively coupled to the DUT to pass through from one side of the element of the platform portion to another side of the element of the platform portion. ### Claim 17 (depends on 13) The testing apparatus of claim 13, wherein the platform portion includes an attachment plate that is to couple to the DUT.