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US 11,892,490 B2Granted
System for measuring a microwave dielectric property of a solid material under force
AssigneeCentral South University
InventorsLixin Wu, Wenfei Mao, Yuan Qi
Life of this patent
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Abstract
Disclosed herein is a system for measuring a microwave dielectric property of a solid material under force. The system measures the microwave dielectric property of the solid material under a horizontal pressure. A shield case for microwave electromagnetic shielding is provided outside the system. The shield case includes a layer of pure aluminum and a layer of pyramids made of a microwave absorbing material. A manual hydraulic pump controls loading and unloading of a pressure loading device.
Claims5
A system for measuring a microwave dielectric property of a solid material under force, comprising:
- a microwave dielectric tester comprising an open coaxial resonator;
- a pressure loading device;
- a shield case for microwave electromagnetic shielding;
- a spring seat;
- and
- a computer;
- wherein the microwave dielectric tester is connected to the spring seat;
- the pressure loading device is connected to the computer;
- the microwave dielectric tester and the pressure loading device are arranged inside the shield case, a sample is in contact with an upper portion of the microwave dielectric tester;
- the pressure loading device is configured to load a horizontal pressure on the sample of the solid material;
- the microwave dielectric tester is configured to measure a dielectric constant and a dielectric loss of the sample under the horizontal pressure, and send measured dielectric constant and dielectric loss to the computer;
- the computer is configured to select a testing mode based on a test demand;
- the shield case is configured to shield an electromagnetic interference from an external environment;
- and the spring seat comprises an embedded spring that is attached to a bottom of the microwave dielectric tester, and the spring seat is configured to buffer the microwave dielectric tester against a compression caused by a deformation of the sample.
11 more elements
Dependencies are inferred from the claim text.