X-ray ripple markers for x-ray calibration
AssigneeKoninklijke Philips N.V.
InventorAlexandru Patriciu
Life of this patent
Estimating the term…
Loading patent…
AssigneeKoninklijke Philips N.V.
InventorAlexandru Patriciu
Estimating the term…
Various embodiments of the present disclosure include a C-arm registration system employing a controller (70) for registering a C-arm (60) to an X-ray ripple marker (20) including a ripple pattern (50) radially extending from a fixed point (40) of the X-ray ripple marker (20). In operation, the controller (70) identifies the ripple pattern (50) within an X-ray image generated from an X-ray projection by the C-arm (60) and illustrative of a portion or an entirety of the ripple pattern (50), the identification of the ripple pattern (50) within the X-ray image is characteristic of a pose of the X-ray projection by the C-arm (60) relative to the X-ray rippler marker (20). The controller (70) further analyzes the ripple pattern (50) within the X-ray image to derive one or more transformation parameters definitive of the pose of the X-ray projection by the C-arm (60) relative to the X-ray rippler marker (20), and registers the C-arm (60) to the X-ray ripple marker (20) based on the transformation parameter(s).
A C-arm registration system, comprising:
A C-arm registration controller, comprising:
A C-arm registration method executable by a C-arm registration controller for registering a C-arm to an X-ray ripple marker including ripple pattern radially extending from a fixed point of the X-ray ripple marker, the C-arm registration method comprising:
Dependencies are inferred from the claim text.