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US 11,889,210 B2Granted
Image sensors
AssigneeSTMicroelectronics (Grenoble 2) SAS
InventorsJerome Chossat, Mathieu Thivin
Life of this patent
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Abstract
An electronic device includes a first array of image pixels having inputs coupled to first selection tracks and outputs coupled to first output tracks, a second array of test pixels having inputs coupled to second selection tracks and outputs coupled to the first output tracks, and a third array of test pixels having inputs coupled to the first selection tracks and outputs coupled to second output tracks. A processor is coupled to receive output signals on the first and second output tracks. The output signals from the test pixels of the second and third arrays are fixed at one or the other of only two values in the absence of a defect. The output signals received by the processor over the first and second output tracks are processed to determine presence or absence of a defect.
Claims24
An electronic device, comprising:
- a first array of image pixels having inputs coupled to first selection tracks and outputs coupled to first output tracks;
- at least one second array of test pixels having inputs coupled to second selection tracks and outputs coupled to the first output tracks;
- at least one third array of test pixels having inputs coupled to the first selection tracks and outputs coupled to second output tracks;
- and
- a processor coupled to receive output signals on the first and second output tracks;
- wherein each test pixel of the second and third arrays is configured to generate the output signal at one of only two possible reference voltage values set by a circuit connection of the test pixel in the absence of a selection track defect or output track defect;
- and
- wherein the processor is configured to identify existence of the selection track defect or output track defect in response to the output signal received from one or a plurality of the test pixels having a value other than said one of the two possible reference voltage values set by the circuit connection.
5 more elements
An electronic device, comprising:
- a first array of image pixels having inputs coupled to first selection tracks and outputs coupled to first output tracks;
- at least one second array of test pixels having inputs coupled to second selection tracks and outputs coupled to the first output tracks;
- at least one third array of test pixels having inputs coupled to the first selection tracks and outputs coupled to second output tracks;
- and
- a processor coupled to receive output signals on the first and second output tracks;
- wherein each test pixel of the second and third arrays is configured to generate the output signal at one of only two possible values set by a circuit connection of the test pixel in the absence of a selection track defect or output track defect;
- and
- wherein the processor is configured to identify existence of the selection track defect or output track defect in response to the output signal received from one or a plurality of the test pixels having a value other than said one of the two possible values set by the circuit connection;
- wherein each test pixel comprises a first MOS transistor having a drain coupled to an input node, a source coupled to a second node, and a gate coupled to one of the selection tracks, a second MOS transistor having a drain coupled to a high reference voltage, a source coupled to the second node, and a gate coupled to a reset signal track, a first follower coupled to the second node and configured to replicate a voltage on the second node towards an output of the first follower, and a third transistor having a drain coupled to the output of the second follower, a source coupled to a read output, and a gate coupled to a readout signal track;
- and
- wherein each image pixel comprises a photodiode, a fourth MOS transistor having a drain coupled to the anode or the cathode of the photodiode, a source coupled to a third node, and a gate coupled to one of the selection tracks, a fifth MOS transistor having a drain coupled to the high reference voltage, a source coupled to the third node, and a gate coupled to a reset signal track, a second follower coupled to the third node and configured to replicate a voltage on the third node towards an output of the second follower, and a sixth transistor having a drain coupled to the output of the second follower, a source coupled to a read output, and a gate coupled to a readout signal track.
8 more elements
An electronic device, comprising:
- an array of image pixels having inputs coupled to first selection tracks and outputs coupled to first output tracks;
- an array of test pixels having inputs coupled to second selection tracks and outputs coupled to the first output tracks;
- and
- a processor coupled to receive output signals on the first output tracks;
- wherein each test pixel of the array of test pixels is configured to generate the output signal at one of only two possible light intensity values set by a circuit connection of the test pixel in the absence of a selection track defect or output track defect;
- and
- wherein the processor is configured to identify existence of the selection track defect or output track defect in response to the output signal received from one or a plurality of the test pixels having a value other than said one of the two possible light intensity values set by the circuit connection.
4 more elements
An electronic device, comprising:
- an array of image pixels having inputs coupled to first selection tracks and outputs coupled to first output tracks;
- an array of test pixels having inputs coupled to second selection tracks and outputs coupled to the first output tracks;
- and
- a processor coupled to receive output signals on the first output tracks;
- wherein each test pixel of the array of test pixels is configured to generate the output signal at one of only two possible values set by a circuit connection of the test pixel in the absence of a selection track defect or output track defect and wherein the processor is configured to identify existence of the selection track defect or output track defect in response to the output signal received from one or a plurality of the test pixels having a value other than said one of the two possible values set by the circuit connection;
- wherein each test pixel comprises a first MOS transistor having a drain coupled to an input node, a source coupled to a second node, and a gate coupled to one of the selection tracks, a second MOS transistor having a drain coupled to a high reference voltage, a source coupled to the second node, and a gate coupled to a reset signal track, a first follower coupled to the second node and configured to replicate a voltage on the second node towards an output of the first follower, and a third transistor having a drain coupled to the output of the second follower, a source coupled to a read output, and a gate coupled to a readout signal track;
- and
- wherein each image pixel comprises a photodiode, a fourth MOS transistor having a drain coupled to the anode or the cathode of the photodiode, a source coupled to a third node, and a gate coupled to one of the selection tracks, a fifth MOS transistor having a drain coupled to the high reference voltage, a source coupled to the third node, and a gate coupled to a reset signal track, a second follower coupled to the third node and configured to replicate a voltage on the third node towards an output of the second follower, and a sixth transistor having a drain coupled to the output of the second follower, a source coupled to a read output, and a gate coupled to a readout signal track.
5 more elements
An electronic device, comprising:
- an array of image pixels having inputs coupled to first selection tracks and outputs coupled to first output tracks;
- an array of test pixels having inputs coupled to the first selection tracks and outputs coupled to second output tracks;
- and
- a processor coupled to receive output signals on the first and second output tracks;
- wherein each test pixel of the array of test pixels is configured to generate the output signal at one of only two possible logic values set by a circuit connection of the test pixel in the absence of a selection track defect or output track defect;
- and
- wherein the processor is configured to identify existence of the selection track defect or output track defect in response to the output signal received from one or a plurality of the test pixels having a value other than said one of the two possible logic values set by the circuit connection.
4 more elements
An electronic device, comprising:
- an array of image pixels having inputs coupled to first selection tracks and outputs coupled to first output tracks;
- an array of test pixels having inputs coupled to the first selection tracks and outputs coupled to second output tracks;
- and
- a processor coupled to receive output signals on the first and second output tracks;
- wherein each test pixel of the array of test pixels is configured to generate the output signal at one of only two possible values set by a circuit connection of the test pixel in the absence of a selection track defect or output track defect and wherein the processor is configured to identify existence of the selection track defect or output track defect in response to the output signal received from one or a plurality of the test pixels having a value other than said one of the two possible values set by the circuit connection;
- wherein each test pixel comprises a first MOS transistor having a drain coupled to an input node, a source coupled to a second node, and a gate coupled to one of the selection tracks, a second MOS transistor having a drain coupled to a high reference voltage, a source coupled to the second node, and a gate coupled to a reset signal track, a first follower coupled to the second node and configured to replicate a voltage on the second node towards an output of the first follower, and a third transistor having a drain coupled to the output of the second follower, a source coupled to a read output, and a gate coupled to a readout signal track;
- and
- wherein each image pixel comprises a photodiode, a fourth MOS transistor having a drain coupled to the anode or the cathode of the photodiode, a source coupled to a third node, and a gate coupled to one of the selection tracks, a fifth MOS transistor having a drain coupled to the high reference voltage, a source coupled to the third node, and a gate coupled to a reset signal track, a second follower coupled to the third node and configured to replicate a voltage on the third node towards an output of the second follower, and a sixth transistor having a drain coupled to the output of the second follower, a source coupled to a read output, and a gate coupled to a readout signal track.
5 more elements
Dependencies are inferred from the claim text.