Utilizing data pattern effect to control read clock timing and bit line kick for read time reduction
AssigneeSanDisk Technologies LLC
InventorsYanjie Wang, Guirong Liang, Xiaoyu Che, Yi Song
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AssigneeSanDisk Technologies LLC
InventorsYanjie Wang, Guirong Liang, Xiaoyu Che, Yi Song
Estimating the term…
A memory apparatus and method of operation is provided. The apparatus includes memory cells each connected to one of a plurality of word lines. The memory cells are disposed in strings coupled to one of a plurality of bit lines and are configured to retain a threshold voltage corresponding to one of a plurality of data states. A control means is configured to read each of the memory cells in a read operation. For each one of the memory cells, the control means is also configured to offset at least one of a bit line settling time and a kick voltage during the read operation based on a probability of at least one neighboring one of the plurality of bit lines being coupled to the memory cells retaining the threshold voltage corresponding to a different one of the plurality of data states than the one of the memory cells.
A memory apparatus, comprising:
A controller in communication with a memory apparatus including memory cells each connected to one of a plurality of word lines and disposed in strings coupled to one of a plurality of bit lines and configured to retain a threshold voltage corresponding to one of a plurality of data states, the controller configured to:
A method of operating a memory apparatus including memory cells each connected to one of a plurality of word lines and disposed in strings coupled to one of a plurality of bit lines and configured to retain a threshold voltage corresponding to one of a plurality of data states, the method comprising the steps of:
Dependencies are inferred from the claim text.