Temperature informed memory refresh
AssigneeMicron Technology, Inc.
InventorsGianni Stephen Alsasua, Harish Reddy Singidi, Kishore Kumar Muchherla, Sampath Ratnam, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Renato Padilla, Jr.
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Abstract
Devices and techniques for temperature informed memory refresh are described herein. A temperature counter can be updated in response to a memory device write performed under an extreme temperature. Here, the write is performed on a memory device element in the memory device. The memory device element can be sorted above other memory device elements in the memory device based on the temperature counter. Once sorted to the top of these memory device elements, a refresh can be performed the memory device element.
Claims20
A memory system comprising:
- a memory component comprising a plurality of memory component elements;
- and
- a processing device, communicatively coupled to the memory component when in operation, the processing device configured to perform operations comprising:
- resetting a write temperature counter for an individual memory component element, of the plurality of memory component elements, in response to the individual memory component element being either erased or opened;
- measuring an ambient temperature while a write is performed on the individual memory component element;
- updating the write temperature counter in response to the ambient temperature being outside of a defined temperature window;
- generating, based on at least the write temperature counter, a sort-value for the individual memory component element by combining a Low Write Temperature Counter and a High Write Temperature Counter;
- and
- selecting the individual memory component element for refresh based on the sort-value.
A method comprising:
- resetting a write temperature counter for an individual memory component element, of a memory component, in response to the individual memory component element being either erased or opened;
- measuring an ambient temperature while a write is performed on the individual memory component element;
- updating the write temperature counter in response to the ambient temperature being outside of a defined temperature window;
- generating, based on at least the write temperature counter, a sort-value for the individual memory component element by combining a Low Write Temperature Counter and a High Write Temperature Counter;
- and
- selecting the individual memory component element for refresh based on the sort-value.
A non-transitory machine readable medium including instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
- resetting a write temperature counter for an individual memory component element, of a memory component, in response to the individual memory component element being either erased or opened;
- measuring an ambient temperature while a write is performed on the individual memory component element;
- updating the write temperature counter in response to the ambient temperature being outside of a defined temperature window;
- generating, based on at least the write temperature counter, a sort-value for the individual memory component element by combining a Low Write Temperature Counter and a High Write Temperature Counter;
- and
- selecting the individual memory component element for refresh based on the sort-value.
Dependencies are inferred from the claim text.