Die family management on a memory device using block family error avoidance

A system comprising:

• a memory device;
• and
• a processing device, operatively coupled to the memory device, the processing device to:
• responsive to determining that predetermined number of program erase cycles (PECs) of a memory device has occurred, identify a target block family of a plurality of block families of the memory device, wherein each block family comprises a plurality of blocks;
• obtain respective temporal voltage shifts of a subset of blocks of the target block family from a plurality of dies associated with the target block family;
• obtain, based on an average of the respective temporal voltage shifts of the subset of blocks, respective die measurements for the plurality of dies;
• and
• assign, based on the respective die measurements, the plurality of dies to respective die families of a plurality of consecutive die families.

A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:

• identifying a bin among a plurality of consecutive bins of a memory device, wherein each bin comprises a plurality of block families each comprising a plurality of blocks;
• obtaining from the bin the block family most recently added to the bin;
• performing a calibration operation on a subset of the blocks of the block family of each die of a plurality of dies associated with the block family;
• obtaining an average temporal voltage shift associated with the calibration operation on the subset of the blocks of the respective die from each die of the plurality of dies;
• and
• assigning each respective die to a die family of a plurality of dies families based on a comparison of the average temporal voltage shift associated with the respective die and a threshold range associated with each die family of the plurality of dies families.