Test information extraction apparatus, test information extraction method and program
AssigneeNippon Telegraph and Telephone Corporation
InventorsTakuya Iwatsuka, Haruto Tanno, Toshiyuki Kurabayashi
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AssigneeNippon Telegraph and Telephone Corporation
InventorsTakuya Iwatsuka, Haruto Tanno, Toshiyuki Kurabayashi
Estimating the term…
A test information extraction device improves efficiency in testing applications by including: an obtainment unit that obtains, from a first source code group of an application that implements methods corresponding to requests of a plurality of types received via a network, first information used for generating the requests; and an extraction unit that specifies, from among the methods implemented in response to the requests, a method being a caller of a method included in a second source code group being a part of the first source code group and that further extracts, from the first information, second information used for generating one of the requests corresponding to the specified method.
A test information extraction device comprising a processor configured to execute a method comprising:
A computer-implemented method for extracting test information, the method comprising:
A computer-readable non-transitory recording medium storing computer-executable program instructions that when executed by a processor cause a computer system to execute a method comprising:
Dependencies are inferred from the claim text.