Automated scan data quality assessment in ultrasonic testing
AssigneeRtx Corporation
InventorsBruno Abreu Calfa, Mahmoud El Chamie, Amit Surana, Ozgur Erdinc
Life of this patent
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Abstract
A system comprising a computer readable storage device readable by the system, tangibly embodying a program having a set of instructions executable by the system to perform the following steps for detecting a sub-surface defect, the set of instructions comprising an instruction to receive scan data for a part from a transducer; an instruction to collect the scan data; an instruction to determine an indication in the scan data that indicates a distractor, wherein the indication is based on a learning phase module and an inference phase module that the processor uses to self-assess the indication; and an instruction to create a defect indication report.
Claims20
A system for detecting a sub-surface defect comprising:
- a transducer fluidly coupled to a part located in a tank containing a liquid configured to transmit ultrasonic energy, said transducer configured to scan said part to create scan data of the scanned part;
- a pulser/receiver coupled to said transducer configured to receive and transmit said scan data;
- a processor coupled to said pulser/receiver, said processor configured to communicate with said pulser/receiver and collect said scan data;
- and said processor configured to detect said sub-surface defect;
- a tangible, non-transitory memory configured to communicate with said processor, the tangible, non-transitory memory having instructions stored therein that, in response to execution by the processor, cause the processor to perform operations comprising:
- receiving, by the processor, said scan data for said part from said transducer;
- collecting, by the processor, the scan data;
- determining, by the processor, a defect indication in the scan data that indicates a distractor, wherein said indication is based on a learning phase module and an inference phase module that the processor uses to self-assess said indication;
- and
- creating, by the processor, a defect indication report.
A system comprising a computer readable storage device readable by the system, tangibly embodying a program having a set of instructions executable by the system to perform the following steps for detecting a sub-surface defect, the set of instructions comprising:
- an instruction to receive scan data for a part from a transducer, the transducer being fluidly coupled to the part located in a tank containing a liquid configured to transmit ultrasonic energy;
- an instruction to collect the scan data;
- an instruction to determine an indication in the scan data that indicates a distractor, wherein said indication is based on a learning phase module and an inference phase module that the processor uses to self-assess said indication;
- an instruction for automated decision making to take corrective action if the indication is the distractor;
- and
- an instruction to create a defect indication report.
A process for detecting a sub-surface defect by use of a system including a transducer fluidly coupled to a part located in a tank containing a liquid configured to transmit ultrasonic energy, said transducer configured to scan said part to create scan data of the scanned part;
- a pulser/receiver coupled to said transducer configured to receive and transmit said scan data;
- a processor coupled to said pulser/receiver, said processor configured to communicate with said pulser/receiver and collect said scan data;
- and said processor configured to detect said sub-surface defect, a tangible, non-transitory memory configured to communicate with said processor, the tangible, non-transitory memory having instructions stored therein that, in response to execution by the processor, cause the processor to perform operations comprising:
- receiving, by the processor, said scan data for said part from said transducer, wherein said scan data comprises at least one of C-scan data and A-scan data;
- collecting, by the processor, the scan data;
- determining, by the processor, a defect indication in the scan data that indicates a distractor, wherein said indication is based on a learning phase module and an inference phase module that the processor uses to self-assess said defect indication;
- and
- creating, by the processor, a defect indication report.
Dependencies are inferred from the claim text.