Abnormality determination method, abnormality determination device, and abnormality determination system
AssigneeSeiko Epson Corporation
InventorKenta Sato
Life of this patent
Estimating the term…
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AssigneeSeiko Epson Corporation
InventorKenta Sato
Estimating the term…
An abnormality determination method includes: a first distance calculation step of calculating, based on measurement data of an object, a first Mahalanobis distance in a first unit space corresponding to a normal mode of the object; a second distance calculation step of calculating, based on the measurement data, an (i+1)-th Mahalanobis distance in an (i+1)-th unit space corresponding to an i-th abnormal mode of the object for each integer i greater than or equal to 1 and less than or equal to N, N being an integer greater than or equal to 2; and an abnormality determination step of determining, based on the second to (N+1)-th Mahalanobis distances, one of the first to N-th abnormal modes where the object is when the first Mahalanobis distance exceeds a threshold value.
An abnormality determination method for causing a processor to execute a process, the abnormality determination method comprising executing on the processor the steps of:
An abnormality determination device comprising:
Dependencies are inferred from the claim text.