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US 11,885,657 B2Granted
Measuring device
AssigneeEndress + Hauser Wetzer GmbH + Co. KG
InventorHarald Bründl
Life of this patent
Estimating the term…
Abstract
The present disclosure relates to a device for determining and/or monitoring at least one process variable of a medium including at least one sensor element and a unit at least partially including a material with anisotropic thermal conductivity. According to the present disclosure the unit is frictionally connected to the sensor element, and in particular the unit is frictionally fastened on a surface of the sensor element.
Claims15
A device for determining and/or monitoring at least one process variable of a medium, the device comprising:
- a sensor element;
- and
- a unit embodied as a thin film, which at least partially comprises a material with anisotropic thermal conductivity,
- wherein the unit is frictionally fastened on a surface of the sensor element, and wherein the film is configured both to enable the frictional fastening of the sensor element and to enable a uniform distribution of heat as to facilitate a thermal equilibrium.
1 more element
Dependencies are inferred from the claim text.