Apparatus, methods, and computer programs for obtaining an image of a sample
AssigneeNokia Technologies Oy
InventorsNoriaki Kaneda, Michael Eggleston
Life of this patent
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Abstract
An apparatus comprising means for: causing illumination of different areas of a sample with an optical frequency imaging beam at different positions at different times, wherein adjacent positions are configured to cause the corresponding areas to at least partially overlap; receiving signals indicative of back-scattering of the optical frequency imaging beam from the sample at the different times; and processing the received signals to obtain an image of the sample, wherein processing the received signals compensates for phase variations between the different positions at the different times using a matched filter derived from a scattering model of the sample.
Claims19
An apparatus comprising:
- a beam generator configured to cause illumination of different areas of a sample with an optical frequency imaging beam at different positions at different times, wherein adjacent positions are configured to cause the corresponding areas to have portions which at least partially overlap;
- a detector configured to receive signals indicative of back-scattering of the optical frequency imaging beam from the sample at the different times;
- and
- circuitry comprising at least one processor configured to process the received signals to obtain an image of the sample, wherein processing of the received signals compensates for phase variations between the different positions at the different times using a matched filter derived from a scattering model of the sample, and at least partially add images of the different areas together which have the overlap portions,
- wherein the different areas lie within an imaging plane which is different from a focal plane, and wherein the processing of the received signals compensates for the phase variations including for the overlap portions of the added together images at the imaging plane.
A method comprising:
- causing illumination of different areas of a sample with an optical frequency imaging beam at different positions at different times, wherein adjacent positions are configured to cause the corresponding areas to have portions which at least partially overlap;
- receiving signals indicative of back-scattering of the optical frequency imaging beam from the sample at the different times;
- and
- processing the received signals to obtain an image of the sample, wherein the processing of the received signals compensates for phase variations between the different positions at the different times using a matched filter derived from a scattering model of the sample, and at least partially adds images of the different areas together which have the overlap portions,
- wherein the different areas lie within an imaging plane which is different from a focal plane, and wherein the processing of the received signals compensates for the phase variations including for the overlap portions of the added together images at the imaging plane.
An apparatus comprising:
- illumination control circuitry configured to cause illumination of different areas of a sample with an optical frequency imaging beam at different positions at different times, wherein adjacent positions are configured to cause the corresponding areas to have portions which at least partially overlap;
- and
- signal processing circuitry configured to process signals indicative of back-scattering of the optical frequency imaging beam from the sample at the different times to obtain an image of the sample, wherein processing the signals compensates for phase variations between the different positions at the different times using a matched filter derived from a scattering model of the sample, and at least partially adds images of the different areas together which have the overlap portions,
- wherein the different areas lie within an imaging plane which is different from a focal plane, and wherein the processing of the received signals compensates for the phase variations including for the overlap portions of the added together images at the imaging plane.
Dependencies are inferred from the claim text.