US 11,874,105 B2 · Measurement system and method for measuring a measurement object, in particular a plastic profile

Abstract

The present disclosure relates to a measuring system for measuring a measured object, in particular a plastic profile, said measuring system comprising: an antenna arrangement of THz transceivers each at times actively emitting a THz transmission beam and passively receiving reflected THz radiation, where said antenna arrangement outputs measuring signals of the measurements of the THz transceivers, an adjustment means for adjusting the antenna arrangement into several measuring positions along an adjustment direction, a control and evaluation device for receiving and evaluating the measuring signals which is configured such that the measuring signals are evaluated by means of a synthetic aperture radar evaluation process and a virtual model of the boundary surfaces of the measured object is created, and subsequently the control and evaluation device determines layer thicknesses between the boundary surfaces from the virtual model.

Claims15

Dependent claims

A measuring system for measuring a measured object, said measuring system comprising:

an antenna arrangement made of a plurality of terahertz (THz) transceivers, each at times actively emitting a THz transmission beam and at times passively receive reflected THz radiation,
wherein said antenna arrangement puts out measuring signals of the measurements of the THz transceivers,
an adjustment means for adjusting the antenna matrix into several measuring positions along an adjustment direction,
a control and evaluation device for receiving and evaluating the measuring signals which is configured in such a way that the measuring signals of said several THz transceivers in said several measuring positions are evaluated by means of a synthetic aperture radar evaluation process and a virtual model of the boundary surfaces of the measured object is created, and
subsequently the control and evaluation device determines layer thicknesses between the boundary surfaces from the virtual model.

2 more elements

A method for measuring a measured object including at least the following steps:

providing or positioning an antenna arrangement made of a plurality of terahertz (THz) transceivers such that an optical axis of the antenna arrangement is aligned with the measured object and/or perpendicular to an axis of symmetry,
carrying out a first terahertz (THz) measurement of the measured object in the first measuring position, said plurality of terahertz (THz) transceivers of the antenna matrix each at times actively emitting a terahertz (THz) transmission beam along or parallel to its optical axis which is partially reflected from the measured object back to the antenna arrangement,
said THz transceivers at times passively detecting reflected terahertz (THz) radiation,
successively adjusting the antenna arrangement along an adjustment direction into several measuring positions in which the optical axis is aligned with measured object and/or perpendicular to the axis of symmetry, and
carrying out further terahertz (THz) measurements while putting out measuring signals,
evaluating the measuring signals from said several measuring positions, where the measuring signals of the individual terahertz (THz) transceivers are processed together by means of a synthetic aperture radar (SAR) evaluation process and a virtual model of a cross-sectional area of the measured object is determined,
determining the reference surfaces and layer thicknesses as distances of the reference surfaces in the virtual model.

4 more elements

Dependencies are inferred from the claim text.

Measurement system and method for measuring a measurement object, in particular a plastic profile

Life of this patent

Measurement system and method for measuring a measurement object, in particular a plastic profile

Life of this patent

Abstract

Claims15