Method and device for predicting malfunctions of a dual-circuit solenoid valve
AssigneeSafran Electronics & Defense
InventorsBlaise Lapôtre, Loïc Parisot
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Abstract
A method for measuring the hardware and operational state of a dual-circuit solenoid valve including first and second coaxial coils each associated with a circuit is disclosed. The method includes the steps of injecting a sinusoidal current into the first coil; measuring the voltage induced across the terminals of the second coil; and plotting at least one curve of a first magnitude proportional to the measured induced voltage as a function of a second magnitude proportional to the injected sinusoidal current.
Claims10
A method for measuring the hardware and operational state of a dual-circuit solenoid valve comprising first and second coaxial coils each associated with a power supply circuit, comprising:
- injecting a sinusoidal current into the first coil;
- measuring the voltage induced across the terminals of the second coil;
- and
- plotting at least one curve of a first magnitude proportional to the measured induced voltage as a function of a second magnitude proportional to the injected sinusoidal current.
A device for measuring the hardware and operational state of a dual-circuit solenoid valve having first and second coaxial coils each associated with a circuit for powering the coils, the device comprising:
- a sinusoidal current generator configured to inject a sinusoidal current into the first coil;
- means for measuring the voltage induced across the terminals of the second coil depending on the intensity of the injected current;
- and
- means for comparing the measured voltage with reference curves.
A device for measuring the hardware and operational state of a dual-circuit solenoid valve having first and second coaxial coils each associated with a circuit for powering the coils, the device comprising:
- a sinusoidal current generator configured to inject a sinusoidal current into the first coil;
- a voltmeter configured to measure the voltage induced across the terminals of the second coil depending on the intensity of the injected current;
- and
- one or more circuits configured to compare the measured voltage with one or more reference curves.
Dependencies are inferred from the claim text.