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US 11,867,505 B2Granted
Interferometric speckle visibility spectroscopy
AssigneeCalifornia Institute of Technology
InventorsJoshua Brake, Jian Xu, Changhuei Yang
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Abstract
Interferometric speckle visibility spectroscopy methods, systems, and non-transitory computer readable media for recovering sample speckle field data or a speckle field pattern from an off-axis interferogram recorded by one or more sensors over an exposure time and determining sample dynamics of a sample being analyzed from speckle statistics of the speckle field data or the speckle field pattern.
Claims15
An interferometric speckle visibility spectroscopy system, comprising:
- one or more optical systems configured to interfere at least one off-axis reference beam with a sample signal;
- one or more sensors configured to record at least one off-axis interferogram over an exposure time;
- and
- one or more processors configured to execute instructions to:
- (i) recover speckle field data or a speckle field pattern based at least in part on the at least one off-axis interferogram;
- and
- (ii) determine at least one decorrelation time based at least in part on speckle statistics of the speckle field data or the speckle field pattern.
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Dependencies are inferred from the claim text.