Method for measuring a sample and microscope implementing the method
AssigneeCarl Zeiss SMT GmbH
InventorsDmitry Klochkov, Chuong Huynh, Thomas Korb, Alex Buxbaum, Amir Avishai
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AssigneeCarl Zeiss SMT GmbH
InventorsDmitry Klochkov, Chuong Huynh, Thomas Korb, Alex Buxbaum, Amir Avishai
Estimating the term…
The present invention relates to a method for measuring a sample with a microscope, the method comprising scanning the sample using a focusing plane having a first angle with respect to a top surface of the sample and computing a confidence distance based on the first angle. The method further comprises selecting at least one among a plurality of alignment markers on the sample for performing a lateral alignment of the scanning step and/or for performing a lateral alignment of an output of the scanning step. In particular, the at least one alignment marker selected at the selecting step is chosen among the alignment markers placed within the confidence distance from an intersection of the focusing plane with the top surface.
A method for measuring a sample with a microscope, the method comprising the steps of:
A method for measuring a sample with a microscope that has a focusing plane, the method comprising the steps of:
Dependencies are inferred from the claim text.