Specimen machining device and information provision method
AssigneeJEOL Ltd.
InventorsTatsuhito Kimura, Munehiro Kozuka, Tsutomu Negishi, Hisashi Kawahara
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AssigneeJEOL Ltd.
InventorsTatsuhito Kimura, Munehiro Kozuka, Tsutomu Negishi, Hisashi Kawahara
Estimating the term…
A specimen machining device for machining a specimen by irradiating the specimen with an ion beam includes an ion source for irradiating the specimen with the ion beam, a specimen stage for holding the specimen, a camera for photographing the specimen, an information provision unit for providing information indicating an expected machining completion time, and a storage unit for storing past machining information. The information provision unit performs processing for calculating the expected machining completion time based on the past machining information, processing for acquiring an image photographed by the camera, processing for calculating a machining speed based on the acquired image, and processing for updating the expected machining completion time based on the machining speed.
A specimen machining device for machining a specimen by irradiating the specimen with an ion beam, the specimen machining device comprising:
An information provision method implemented in a specimen machining device for machining a specimen by irradiating the specimen with an ion beam, the specimen machining device including an ion source for irradiating the specimen with the ion beam, a specimen stage for holding the specimen, and a camera for photographing the specimen, the information provision method comprising:
Dependencies are inferred from the claim text.