Back to results
US 11,821,870 B2Granted
Defect measurement device, defect measurement method, and inspection probe
AssigneeSumitomo Chemical Company, Limited
InventorsToyokazu Tada, Hidehiko Suetsugu
Life of this patent
Estimating the term…
Abstract
An inspection probe (100) includes a Hall element (3) which detects the density of magnetic flux flowing in a magnetic circuit formed by a yoke (1), a magnet (2), and a magnetic pipe (P). A second outer circumferential surface (12a) of the yoke (1) is arranged to be located closer to the magnetic pipe (P) than a first outer circumferential surface (11a) of the yoke (1) is to the magnetic pipe (P).
Claims8
A defect measuring device for measuring a defect of a magnetic member so as to inspect the defect, the defect measuring device comprising:
- an inspection probe including
- a magnet,
- a yoke configured to be located on an opposite side of the magnet from the magnetic member, and
- a magnetic sensor which is configured to be located between the yoke and the magnetic member and which is configured to detect a density of magnetic flux flowing in a magnetic circuit, the magnetic circuit being formed by the magnet, the yoke, and the magnetic member;
- and
- a calculating section configured to calculate a depth of the defect of the magnetic member based on an output from the magnetic sensor,
- the yoke having a first outer circumferential surface and a second outer circumferential surface, the first outer circumferential surface being arranged to face the magnetic member with the magnet interposed between the first outer circumferential surface and the magnetic member, the second outer circumferential surface being arranged to face the magnetic member with the magnetic sensor interposed between the second outer circumferential surface and the magnetic member,
- the second outer circumferential surface being arranged to be located closer to the magnetic member than the first outer circumferential surface is to the magnetic member,
- wherein a stepped portion of the yoke separates the first outer circumferential surface from the second outer circumferential surface, and the first outer circumferential surface is positioned lower than the stepped portion, and the second outer circumferential surface is positioned higher than the stepped portion,
- the inspection probe is configured to be inserted into the magnetic member, the magnetic member having a substantially cylindrical shape, and
- a length of the second outer circumferential surface in an axial direction of the magnetic member is longer than a length of the magnetic sensor in the axial direction.
8 more elements
An inspection probe configured to inspect a defect of a magnetic member, the inspection probe comprising:
- a magnet;
- a yoke configured to be located on an opposite side of the magnet from the magnetic member;
- and
- a magnetic sensor which is configured to be located between the yoke and the magnetic member and which is configured to detect a density of magnetic flux flowing in a magnetic circuit, the magnetic circuit being formed by the magnet, the yoke, and the magnetic member,
- the yoke having a first outer circumferential surface and a second outer circumferential surface, the first outer circumferential surface being arranged to face the magnetic member with the magnet interposed between the first outer circumferential surface and the magnetic member, the second outer circumferential surface being arranged to face the magnetic member with the magnetic sensor interposed between the second outer circumferential surface and the magnetic member,
- the second outer circumferential surface being arranged to be located closer to the magnetic member than the first outer circumferential surface is to the magnetic member,
- wherein a stepped portion of the yoke separates the first outer circumferential surface from the second outer circumferential surface, and the first outer circumferential surface is positioned lower than the stepped portion, and the second outer circumferential surface is positioned higher than the stepped portion,
- the inspection probe is configured to be inserted into the magnetic member, the magnetic member having a substantially cylindrical shape, and
- a length of the second outer circumferential surface in an axial direction of the magnetic member is longer than a length of the magnetic sensor in the axial direction.
6 more elements
Dependencies are inferred from the claim text.