Back to results
US 11,816,765 B2Granted
System and method for the proscriptive determination of parameters for iterative reconstruction
AssigneeCarl Zeiss X-ray Microscopy, Inc.
InventorsMatthew Andrew, William Thompson
Life of this patent
Estimating the term…
Abstract
A x-ray micro tomography system provides the ability to proscriptively determine regularization parameters for iterative reconstruction of a sample, from projection data of the sample. This allows a less experienced operator to determine the regularization parameters with adequate precision.
Claims14
An x-ray micro tomography system, comprising:
- an x-ray microscopy system including an x-ray source system for generating an x-ray beam, and a detector system for detecting the x-ray beam after transmission through a sample to generate projection data;
- and
- a computer system for determining parameters and then executing iterative reconstruction using the projection data and the determined parameters to generate a volume dataset of the sample, wherein the parameters are determined by performing an initial reconstruction using back projection on at least a portion of the sample.
A method for an x-ray micro tomography system, comprising:
- generating an x-ray beam;
- detecting the x-ray beam after transmission through the sample to generate projection data;
- performing an initial reconstruction using back projection;
- a computer system determining parameters from the initial reconstruction;
- the computer system executing iterative reconstruction using the projection data and the determined parameters to generate a volume dataset of the sample.
2 more elements
Dependencies are inferred from the claim text.