Identifying data valid windows

A method comprising:

• sequentially acquiring read data from an electronic device at sequential testing points of a testing range for evaluating an operating parameter of the electronic device or an electronic device tester until a first passing point and a last passing point of consecutive passing points are identified;
• in response to identifying the first passing point, writing data within a first register of a logic chip of the electronic device tester identifying the first passing point;
• in response to identifying a passing point after the first passing point, writing data within a second register of the logic chip of the electronic device tester identifying the passing point;
• repeating the writing of data within the second register of the logic chip for each one of further passing points until a sequential testing point fails, so that the data remaining within the second register of the logic chip identifying a preceding passing point identifies the last passing point;
• determining whether a data valid window represented by the identified first passing point and the identified last passing point is greater than or equal to a user-defined, acceptable data valid window;
• in response to determining that the data valid window represented by the identified first passing point and the identified last passing point is greater than or equal to a user-defined, acceptable data valid window, terminating evaluation of the electronic device;
• in response to determining that the data valid window represented by the identified first passing point and the identified last passing point is not greater than or equal to a user-defined, acceptable data valid window, continuing to evaluate the electronic device at further testing points of the sequential testing points of the testing range until a new first passing point and a new last passing point of a new set of consecutive passing points are identified;
• and
• based at least partially on the data valid window, evaluating the operating parameter of the electronic device or an electronic device tester.

An apparatus, comprising:

• an interface configured to interface with an electronic device;
• a pattern generator;
• at least one finite-state machine;
• and
• a logic circuit configured to:
• sequentially acquire read data from the electronic device at sequential testing points of a testing range for evaluating an operating parameter until consecutive passing points having a first passing point and a last passing point are identified;
• in response to identifying the first passing point, write data within a first register of the logic circuit indicating the first passing point;
• in response to identifying a passing point after the first passing point, write data within a second register of the logic circuit indicating the passing point;
• repeat the writing of data within the second register of the logic circuit for each one of further passing points until a sequential testing point fails, so that the data remaining within the second register of the logic circuit indicating a preceding passing point indicates the last passing point;
• and
• output data identifying the first passing point and data identifying the last passing point to a software application.

A method comprising:

• sequentially acquiring read data from an electronic device at sequential testing points of a testing range via a tester for evaluating an operating parameter of the electronic device or the tester until a window having consecutive passing points having a first passing point and a last passing point is identified;
• in response to identifying the first passing point, writing data within a first register of a logic circuit of the tester indicating the first passing point;
• in response to identifying a passing point after the first passing point, writing data within a second register of the logic circuit indicating the passing point;
• repeating the writing of data within the second register of the logic circuit for each one of further passing points until a sequential testing point fails, so that the data remaining within the second register of the logic circuit indicating a preceding passing point indicates the last passing point;
• outputting data identifying the first passing point and data identifying the last passing point to a software application;
• and
• based at least partially on the data identifying the first passing point and the data identifying the last passing point, evaluating the operating parameter of the electronic device or an electronic device tester.