Charged particle beam device and power supply device
AssigneeHitachi High-Tech Corporation
InventorsWen Li, Hiroyuki Takahashi, Makoto Suzuki, Yuzuru Mizuhara
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AssigneeHitachi High-Tech Corporation
InventorsWen Li, Hiroyuki Takahashi, Makoto Suzuki, Yuzuru Mizuhara
Estimating the term…
The invention provides a power supply device and a charged particle beam device capable of reducing noise generated between a plurality of voltages. The charged particle beam device includes a charged particle gun configured to emit a charged particle beam, a stage on which a sample is to be placed, and a power supply circuit configured to generate a first voltage and a second voltage that determine energy of the charged particle beam and supply the first voltage to the charged particle gun. The power supply circuit includes a first booster circuit configured to generate the first voltage, a second booster circuit configured to generate the second voltage, and a switching control circuit configured to perform switching control of the first booster circuit and the second booster circuit using common switch signals.
A charged particle beam device comprising:
A power supply device that supplies a first voltage and a second voltage, the power supply device comprising:
Dependencies are inferred from the claim text.