Fast convergence method for cross-correlation based modulation quality measurements
AssigneeNational Instruments Corporation
InventorSartaj Chaudhary
Life of this patent
Estimating the term…
Loading patent…
AssigneeNational Instruments Corporation
InventorSartaj Chaudhary
Estimating the term…
Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a complex-valued cross-correlation measurement, and a real component of the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.
A method, comprising:
A measurement system for determining a modulation quality measurement, the system comprising:
A method, comprising:
Dependencies are inferred from the claim text.