Apparatuses and methods for combined simultaneous analyses of materials

A method for performing analyses of multiple locations on a sample surface, comprising:

• (a) mounting a sample holder having a prepared sample therein or thereon onto a moveable stage assembly or loading the prepared sample onto or into a sample holder on the moveable stage assembly of an analysis apparatus that comprises:
• a first X-ray source and a first X-ray detector or detector array, wherein the first X-ray source is configured to emit a first X-ray beam that is configured to intercept the surface of the prepared sample that is mounted on or within the sample holder at a first sample location and wherein the first X-ray detector or detector array is configured to detect X-rays that are emitted from the first sample location;
• and
• a second X-ray source and a second X-ray detector or detector array, wherein the second X-ray source is configured to emit a second X-ray beam that is configured to intercept the surface of the prepared sample that is mounted on or within the sample holder at a second sample location, the second sample location being spaced apart from the first sample location, and wherein the second X-ray detector or detector array is configured to detect X-rays that are emitted from the second sample location;
• (b) acquiring first data relating to X-rays emitted from the first sample location and detected by the first X-ray detector or detector array and simultaneously acquiring second data relating to X-rays emitted from the second sample location and detected by the second photon detector or detector array;
• (c) operating the moveable stage assembly such that the first X-ray beam intercepts the surface of the prepared sample at a third sample location;
• and
• (d) acquiring third data relating to X-rays emitted from the third sample location and detected by the first X-ray detector or detector array.