Active rise and fall time compensation algorithm
AssigneeKoninklijke Philips N.V.
InventorJeroen Van Brussel
Life of this patent
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Abstract
A method for compensating the settings of a pulsed X-ray system. The method selects current, voltage, and intended pulse width settings for the X-ray pulses. The method then compensates the selected pulse width setting for the set voltage and tube current, in accordance with at least one stored normalized value at a predetermined temperature, taking into account the environmental temperature of the electric circuitry of an X-ray tank of the X-ray system. The at least one normalized value is obtained in a calibration step based on the actual pulse width and the difference thereof with the intended pulse width at a predetermined temperature, taking into account the internal temperature of the X-ray tank.
Claims20
A method of calibrating an X-ray system, the method comprising:
- applying settings for a selected current, a selected voltage, and an intended pulse width to an X-ray source of the X-ray system to generate an actual voltage signal and a current signal for the X-ray source to produce at least one X-ray pulse, the produced at least one X-ray pulse having an actual pulse width;
- measuring the actual voltage signal applied to the X-ray source;
- determining the actual pulse width based on the measured actual voltage signal;
- obtaining a difference between the actual pulse width and the intended pulse width;
- obtaining a normalized value from the difference at a predefined temperature, taking into account the internal temperature of an X-ray tank comprising the X-ray source, the internal temperature being an environmental temperature for electronic circuitry of the X-ray tank;
- and
- storing the normalized value as a function of the settings for the selected current and the selected voltage.
A non-transitory computer-readable storage medium having stored a computer program comprising instructions which, when executed by a processor, cause the processor to:
- apply settings for a selected current, a selected voltage, and an intended pulse width to an X-ray source of an X-ray system to generate an actual voltage signal and a current signal for the X-ray source to produce at least one X-ray pulse, the produced at least one X-ray pulse having an actual pulse width;
- measure the actual voltage signal applied to the X-ray source;
- determine the actual pulse width based on the measured actual voltage signal;
- obtain a difference between the actual pulse width and the intended pulse width;
- obtain a normalized value from the difference at a predefined temperature, taking into account an internal temperature of an X-ray tank comprising the X-ray source, the internal temperature being an environmental temperature for electronic circuitry of the X-ray tank;
- and
- store the normalized value as a function of the settings for the selected current and the selected voltage.
An X-ray system comprising:
- an X-ray tank including an X-ray source;
- and
- a controller comprising circuitry configured to:
- apply settings for a selected current, a selected voltage, and an intended pulse width to the X-ray source to generate an actual voltage signal and a current signal for the X-ray source to produce at least one X-ray pulse, the produced at least one X-ray pulse having an actual pulse width;
- measure the actual voltage signal applied to the X-ray source;
- determine the actual pulse width based on the measured actual voltage signal;
- obtain a difference between the actual pulse width and the intended pulse width;
- obtain a normalized value from the difference at a predefined temperature, taking into account an internal temperature of an X-ray tank comprising the X-ray source, the internal temperature being an environmental temperature for electronic circuitry of the X-ray tank;
- and
- store the normalized value as a function of the settings for the selected current and the selected voltage.
Dependencies are inferred from the claim text.