Method, electronic apparatus, and system for defect detection

A method for defect detection in an electronic apparatus, the method comprising:

• determining a measurement configuration for a plurality of piezoelectric devices in the electronic apparatus while the electronic apparatus is in operation, the electronic apparatus including a substrate block, an electronic device mounted on the substrate block using a bonding layer, and the plurality of piezoelectric devices being attached to one of the electronic device and the bonding layer;
• performing, based on the measurement configuration, a defect measurement on the electronic apparatus by causing a first subset of the plurality piezoelectric devices to transmit acoustic signals and causing a second subset of the plurality piezoelectric devices to receive the acoustic signals;
• and
• determining whether at least one mechanical defect is located in at least one of (i) the bonding layer, (ii) the electronic device, (iii) the substrate block, (iv) a first interface between the bonding layer and the electronic device, and (v) a second interface between the electronic device and the substrate block based on the received acoustic signals.