On-die techniques for asynchnorously comparing voltages
AssigneeNVIDIA Corporation
InventorsNishit Harshad Shah, Ting Ku, Krishnamraju Kurra, Gunaseelan Ponnuvel, Tezaswi Raja, Suhas Satheesh
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AssigneeNVIDIA Corporation
InventorsNishit Harshad Shah, Ting Ku, Krishnamraju Kurra, Gunaseelan Ponnuvel, Tezaswi Raja, Suhas Satheesh
Estimating the term…
In various embodiments, a comparison circuit compares voltages within an integrated circuit. The comparison circuit includes a comparison capacitor, an inverter, and multiple switches. A first terminal of the comparison capacitor is coupled to both a first terminal of a first switch and a first terminal of a second switch. A second terminal of the comparison capacitor is coupled to both a first terminal of a third switch and an input of the inverter. An output of the inverter is coupled to both a second terminal of the third switch and a first terminal of a fourth switch. A second terminal of the fourth switch is coupled to a first terminal of a fifth switch and a first output of the comparison circuit. At least a portion of the switches are turned on during a comparison model and are turned off during a reset mode.
A comparison circuit, comprising:
A method for comparing voltages within an integrated circuit, the method comprising:
Dependencies are inferred from the claim text.