Plasmonic field-enhanced photodetector and image sensor
OwnerHoon Kiminventor
Life of this patent
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Abstract
A photodetector includes a metal layer that shields incident light and generates surface plasmon polaritons (SPPs), a light absorbing layer that absorbs the generated SPPs and allows charges excited by the absorbed SPPs and a localized electric field effect to tunnel, a dielectric formed at nanoholes in which at least a part of the metal layer is opened, and a semiconductor layer that induces the photocurrent based on an electric field effect of tunneled electrons. The SPPs form localized surface plasmons (LSPs) at an interface where the metal layer meets the dielectric.
Claims16
A photodetector comprising:
- a metal layer that shields incident light propagating in air and generates surface plasmon polaritons (SPPs);
- a light absorbing layer that absorbs the generated SPPs and allows charges, including electrons, excited by the absorbed SPPs and a localized electric field effect to tunnel;
- a dielectric formed at nanoholes in which at least a part of the metal layer is opened and formed over the light absorbing layer;
- and
- a semiconductor layer that induces photocurrent based on an electric field effect of the tunneled electrons,
- wherein the SPPs form localized surface plasmons (LSPs) propagating at an edge where the metal layer meets the dielectric and the SPPs are absorbed into the semiconductor layer.
An image sensor comprising:
- a metal surface;
- a metal nanohole array formed on the metal surface;
- and
- a detector array formed at a position corresponding to the metal nanohole array,
- wherein the metal surface is configured to shield incident light propagating in air and to generate surface plasmon polaritons (SPPs),
- wherein the detector array comprises:
- a light absorbing layer that absorbs the generated SPPs and allows charges, including electrons, excited by the absorbed SPPs and a localized electric field effect to tunnel;
- a dielectric formed at nanoholes in which at least a part of the metal surface is opened and formed over the light absorbing layer;
- and
- a semiconductor layer that induces photocurrent based on an electric field effect of the tunneled electrons,
- wherein the SPPs form localized surface plasmons (LSPs) propagating at an edge where the metal surface meets the dielectric and the SPPs are absorbed into the semiconductor layer.
A method of operating a photodetector, the method comprising:
- generating, at a metal layer that shields incident light propagating in air, surface plasmon polaritons (SPPs), the SPPs being generated by combining surface plasmons (SPs) with photons of a light wave;
- absorbing, at a light absorbing layer, the generated SPPs;
- and
- generating photocurrent, at a semiconductor layer, by using the absorbed SPPs,
- wherein the SPPs form localized surface plasmons (LSPs) propagating at an edge where the metal layer meets a dielectric formed at nanoholes in which at least a part of the metal layer is opened and formed over the light absorbing layer, and the SPPs are absorbed into the semiconductor layer.
A method of operating an image sensor, the method comprising:
- generating photocurrent by using a metal nanohole array formed on a metal surface and a detector array formed at a position corresponding to the metal nanohole array,
- wherein the generating photocurrent comprises:
- generating surface plasmon polaritons (SPPs) at a metal surface that shields incident light propagating in air, the SPPs being generated, by the detector array, by combining surface plasmons (SPs) formed on the metal surface with photons of a light wave;
- absorbing at a light absorbing layer the generated SPPs;
- and
- generating, at a semiconductor layer, the photocurrent by using the absorbed SPPs by the detector array,
- wherein the SPPs form localized surface plasmons (LSPs) at an edge where the metal surface meets a dielectric formed at nanoholes in which at least a part of the metal surface is opened and formed over the light absorbing layer, and the SPPs are absorbed into the semiconductor layer.
Dependencies are inferred from the claim text.